公开(公告)号：US11598803B1

公开(公告)日：2023-03-07

申请号：US17352553

申请日：2021-06-21

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ray Wang

IPC: G01R31/302 ,  H04B3/48

Abstract: System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive RF signal testing of a RF data signal transceiver device under test (DUT). Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies enables isolation of and compensation for power loss due to a mismatch between the RF signal probe and RF DUT connection based on predetermined losses of the RF signal path.

公开(公告)号：US11855707B2

公开(公告)日：2023-12-26

申请号：US17352546

申请日：2021-06-21

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ray Wang

IPC: H04B17/00 ,  G01R31/28

CPC classification number: H04B17/0085 ,  G01R31/2822

Abstract: System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.

公开(公告)号：US20220407610A1

公开(公告)日：2022-12-22

申请号：US17352546

申请日：2021-06-21

Applicant: LitePoint Corporation

Inventor： Chen Cao ,  Christian Volf Olgaard ,  Ray Wang

IPC: H04B17/00 ,  G01R31/28

Abstract: System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.