公开(公告)号：US20250148273A1

公开(公告)日：2025-05-08

申请号：US18926397

申请日：2024-10-25

Applicant: MEDIATEK INC.

Inventor： Khim Jun Koh ,  Chi-Ming Lee ,  Yi-Ju Ting ,  Chung-Kai Chang ,  Po-Chao Tsao ,  Chin-Wei Lin ,  Yu-Lin Yang ,  Tung-Hsing Lee ,  Chin-Tang Lai

IPC: G06N3/0499

Abstract: In an aspect of the disclosure, a method for detecting outlier integrated circuits on a wafer is provided. The method comprises: operating multiple test items for each IC on the wafer to generate measured values of the multiple test items for each IC; selecting a target IC and neighboring ICs on the wafer repeatedly. each time after selecting the target IC executes the following steps: selecting a measured value of the target IC as a target measured value and selecting measured values of the target IC and the neighboring ICs as feature values of the target IC and the neighboring ICs; executing a transformer deep learning model to generate a predicted value of the target measured value; and identifying outlier ICs according to the predicted values of all the target ICs and the corresponding target measured values of all the target ICs.