公开(公告)号：US20150276390A1

公开(公告)日：2015-10-01

申请号：US14668171

申请日：2015-03-25

Applicant: MITUTOYO CORPORATION

Inventor： Ryoichi IMAIZUMI ,  Ichiro TANIGUCHI

IPC: G01B11/25 ,  G01B11/08

CPC classification number: G01B11/2504 ,  G01B11/08 ,  G01B11/2433 ,  G01B11/2518

Abstract: A correction device for an optical measuring apparatus obtains correction data for each scanning position of a light beam from an optical measuring apparatus that includes a light beam scanner which scans with a light beam a measuring region where a measured object is placed, and a light receiver which receives a transmitted light beam from the measuring region. The correction device includes a translucent scale having scale marks arranged at a predetermined pitch, and a support to mount the scale in the measuring region so that an arrangement direction of the scale marks is a scanning direction of the light beam.

Abstract translation: 用于光学测量装置的校正装置获得来自光学测量装置的光束的每个扫描位置的校正数据，所述光学测量装置包括：用光束扫描被测物体的测量区域的光束扫描器;以及光接收器 其接收来自测量区域的透射光束。 校正装置包括具有以预定间距排列的刻度标记的半透明刻度和用于将刻度尺安装在测量区域中的支架，使得刻度标记的布置方向为光束的扫描方向。

公开(公告)号：US20200318948A1

公开(公告)日：2020-10-08

申请号：US16825233

申请日：2020-03-20

Applicant: Mitutoyo Corporation

Inventor： Ryoichi IMAIZUMI ,  Ichiro TANIGUCHI

IPC: G01B11/08 ,  G01B11/24

Abstract: An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallely moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.

公开(公告)号：US20140268177A1

公开(公告)日：2014-09-18

申请号：US14217704

申请日：2014-03-18

Applicant: MITUTOYO CORPORATION

Inventor： Osamu SAITO ,  Ichiro TANIGUCHI

IPC: G01B11/00

CPC classification number: G01B11/00 ,  G01B11/2518

Abstract: A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce light; and an optical element configured to linearly spread the light from the light source and generate the line laser, the optical element being constructed rotatably around an optical axis of the line laser; and an imaging part configured to image the line laser reflected by the work.

Abstract translation: 一种形状测量装置，包括：被配置为用线性激光照射工件的照射部，所述照射部包括：被配置为产生光的光源; 以及光学元件，被配置为从所述光源线性地扩展光并产生所述线激光器，所述光学元件围绕所述线激光器的光轴可旋转地构造; 以及被配置为对由工件反射的线激光成像的成像部。