公开(公告)号：US20190149805A1

公开(公告)日：2019-05-16

申请号：US16243106

申请日：2019-01-09

申请人： Apple Inc.

发明人： Alexander Shpunt ,  Benny Pesach ,  Ronen Akerman

IPC分类号： H04N13/271 ,  H04N13/363 ,  H04N5/33 ,  H04N13/398 ,  G06T17/00 ,  H04N13/365 ,  G01B11/25 ,  H04N13/254

CPC分类号： H04N13/271 ,  G01B11/2518 ,  G06T17/00 ,  H04N5/332 ,  H04N13/254 ,  H04N13/363 ,  H04N13/365 ,  H04N13/398

摘要： Apparatus for mapping includes a radiation source, which is configured to emit at least one beam of radiation, and a detector and optics, which define a sensing area of the detector. A scanner is configured to receive and scan the at least one beam over a selected angular range within a region of interest while scanning the sensing area over the selected angular range in synchronization with the at least one beam from the radiation source. A processor is configured to process signals output by the detector in order to construct a three-dimensional (3D) map of an object in the region of interest.

公开(公告)号：US20180297242A1

公开(公告)日：2018-10-18

申请号：US15489188

申请日：2017-04-17

申请人： Indian Institute of Technology Bombay ,  CEAT Tyres Ltd.

发明人： Ramesh Kumar Singh ,  Sachin Alya ,  Rinku Kumar Mittal ,  Adbul Rahim ,  Shashikant Kharat ,  Pratik Sampatraj Parmar ,  Kumar Keshav

IPC分类号： B29C33/72 ,  B29D30/06 ,  B08B7/00 ,  G01B11/25

CPC分类号： B29C33/72 ,  B08B5/02 ,  B08B7/0042 ,  B29C33/10 ,  B29D30/0606 ,  B29D30/0662 ,  B29D2030/0663 ,  B29L2030/00 ,  G01B11/002 ,  G01B11/2518

摘要： A vent hole cleaning system is disclosed. The cleaning system is comprised of a housing containing a work table and a support column. The system further comprises a robotic arm mounted on the support column. Further, a subsystem is mounted at an end, opposite to the support column, of the robotic arm. The subsystem may comprise a scanner configured to generate a contour profile of a mold. Further, a vision system may be mounted on the subsystem. The vision system may be communicably connected to the scanner. Further, the system may comprise a cleaning head communicably connected to the vision system and the scanner to enable precision positioning on the mold.

公开(公告)号：US20180293746A1

公开(公告)日：2018-10-11

申请号：US15482375

申请日：2017-04-07

申请人： Massachusetts Institute of Technology

发明人： Guy Rosman ,  Daniela Rus ,  John W. Fisher, III

IPC分类号： G06T7/521 ,  G01B11/25 ,  G06T17/05 ,  G06K9/20

CPC分类号： G06T7/521 ,  G01B11/2518 ,  G06K9/2036 ,  G06K2209/40 ,  G06T17/05

摘要： A scanner system is configured for acquiring three dimensional image information of an object. The scanner includes a projector, a camera, a graphics processing device, and a processor. The projector projects one of several pre-defined patterns upon the object. The camera captures an image from the object, which is received by the processor. The processor approximates mutual information from the object and the pattern using the graphics processing device, and selects a second pattern for projecting on the object.

公开(公告)号：US10060734B2

公开(公告)日：2018-08-28

申请号：US15025736

申请日：2014-09-26

申请人： Panasonic Intellectual Property Management Co., Ltd.

发明人： Harumi Yamamoto ,  Hajime Jikihara

IPC分类号： G01B11/25 ,  G01S17/89 ,  G01B11/24

CPC分类号： G01B11/2518 ,  G01B11/24 ,  G01B11/2545 ,  G01S17/89

摘要： The dimension measurement device of one aspect of the present invention includes: an obtainer configured to obtain, from a measurement device for performing three dimensional measurement of a desired object, a set of coordinates in three dimensions of the desired object; a surface extractor configured to determine a focused surface constituting the desired object based on the set of coordinates, and extract a position of a boundary of the focused surface; a region extractor configured to extract, in relation to a candidate region corresponding to an object being a specific object attached to the focused surface, a position of an edge surrounding the candidate region; and a dimension generator configured to generate dimensional data necessary for creating a dimensional drawing of the desired object from the position of the boundary and the position of the edge.

公开(公告)号：US20180156608A1

公开(公告)日：2018-06-07

申请号：US15577191

申请日：2016-07-11

申请人： RENISHAW PLC

发明人： Calum Conner MCLEAN ,  Ian William MCLEAN

IPC分类号： G01B21/04 ,  G01B11/00

CPC分类号： G01B21/042 ,  G01B11/002 ,  G01B11/2518

摘要： A method of measuring at least one point on an artefact to be inspected that is located within a positioning apparatus' measurement volume, the method comprising, obtaining at least two images of the artefact obtained from different perspectives and, based on a given nominal location of a predetermined point to be measured within said positioning apparatus' measurement volume, determine the location of said predetermined point in each of the at least two images.

公开(公告)号：US09989353B2

公开(公告)日：2018-06-05

申请号：US15683892

申请日：2017-08-23

申请人： FARO Technologies, Inc.

发明人： Sebastian Bartmann ,  Helmut Kramer ,  Daniel Pompe ,  Michael Schanz

IPC分类号： G01B11/24 ,  G01B11/00 ,  G01S17/89 ,  G01S17/02 ,  G01S7/48 ,  G01B11/25 ,  G01B21/16 ,  G01S17/06

CPC分类号： G01B11/002 ,  G01B11/2518 ,  G01B21/16 ,  G01S7/4808 ,  G01S17/023 ,  G01S17/06 ,  G01S17/89

摘要： A method for optically scanning and measuring a scene by a laser scanner includes generating multiple scans; tracking scanner positions with a position-tracking device for the multiple scans and providing tracked scanner positions in response; registering sequentially scans selected from the multiple scans into clusters using registration points or targets and confirming registration of the scans into the clusters according to specified quality criteria being fulfilled; selecting scans from the clusters and forming pairs of scans; forming an intersection of the selected pairs and comparing a size of the intersection with a threshold value obtained based at least in part on the tracked scanner positions; and attempting to register the pairs of scans if the size of the intersection exceeds the threshold value and accepting the registered pairs of scans if the registration is successful.

公开(公告)号：US20180149472A1

公开(公告)日：2018-05-31

申请号：US15571803

申请日：2016-05-04

申请人： Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. ,  Friedrich-Schiller-Universität Jena

发明人： Stefan Heist ,  Gunther Notni ,  Kevin Srokos ,  Peter Lutzke ,  Ingo Schmidt ,  Peter Kühmstedt

IPC分类号： G01B11/25

CPC分类号： G01B11/2545 ,  G01B11/2518 ,  G01B11/254

摘要： A device, for spatially measuring surfaces, includes a projector for projecting patterns into an object space, two cameras for recording pictures of a surface in the object space, and a control and evaluation unit for activating the cameras and evaluating the pictures. The projector includes a light source, a projection lens, at least one rotatably arranged pattern structure, and a drive for rotating the at least one pattern structure. The control and evaluation unit to: activate the cameras for simultaneously recording a picture at each of a plurality of successive points in time; identify corresponding points in the picture planes of the cameras, by way of evaluating a correlation function between the sequences of brightness values acquired for potentially corresponding points and maximizing a value of the correlation; and determine spatial coordinates of surface points by way of triangulation on the basis of the identified corresponding points.

公开(公告)号：US09982995B2

公开(公告)日：2018-05-29

申请号：US14117446

申请日：2012-05-11

申请人： Dmitry Nikolayevich Znamenskiy ,  Ruud Vlutters ,  Karl Catharina Van Bree

发明人： Dmitry Nikolayevich Znamenskiy ,  Ruud Vlutters ,  Karl Catharina Van Bree

IPC分类号： G06K9/00 ,  H04N13/00 ,  G01B11/25 ,  G06T7/521 ,  G06T7/586

CPC分类号： G01B11/2518 ,  G01B11/2513 ,  G01B11/2536 ,  G06T7/521 ,  G06T7/586 ,  G06T2207/10012 ,  G06T2207/10028 ,  G06T2207/10152

摘要： A series of structured lighting patterns are projected on an object. Each successive structured lighting pattern has a first and second subset of intensity features such as edges between light and dark areas. The intensity features of the first set coincide spatially with intensity features from either the first or second subset from a preceding structured lighting pattern in the series. Image positions are detected where the intensity features of the first and second subset of the structured lighting patterns are visible in the images. Image positions where the intensity features of the first subset are visible are associated with the intensity features of the first subset, based on the associated intensity features of closest detected image positions with associated intensity features in the image obtained with a preceding structured lighting pattern in said series. Image positions where the intensity features of the second subset are visible, between pairs of the image positions associated with intensity features of the first subset, with intensity features of the second subset between the intensity features associated with the pair of positions. The associated intensity features in a final structured lighting pattern of the series are used to identify the intensity features of the final structured lighting pattern for the determination of 3D surface position information.

公开(公告)号：US09964399B2

公开(公告)日：2018-05-08

申请号：US14207140

申请日：2014-03-12

申请人： BWXT Nuclear Energy, Inc. ,  BWXT Canada Ltd.

发明人： Richard W. Hundstad ,  Rajendra Persad ,  Nathaniel R. Bruns ,  Daniel E. Gammage

IPC分类号： G01B11/00 ,  G01N21/00 ,  G01B11/02 ,  G01N21/88 ,  G01B11/25 ,  F22B37/00

CPC分类号： G01B11/026 ,  F22B37/003 ,  G01B11/2518 ,  G01N21/8806 ,  G01N21/8851

摘要： A component, such as a cyclonic steam separator baseplate of a steam generator, includes a surface subject to degradation during operation of the system in which the component is disposed. A profile is acquired of the surface of the component using an optical surface profilometry system concurrent with an image of the surface. A condition, such as degradation of the component is classified based on the acquired profile and image of the surface of the component. Component conditions may be monitored over time, trended, and classified as requiring maintenance, repair, or replacement.

公开(公告)号：US09939258B2

公开(公告)日：2018-04-10

申请号：US15593680

申请日：2017-05-12

申请人： ALIGN TECHNOLOGY, INC.

发明人： Erez Lampert ,  Adi Levin ,  Tal Verker

IPC分类号： G01B11/24 ,  G01B11/25 ,  A61C9/00 ,  G01S17/08 ,  G02B23/24 ,  G02B3/00

CPC分类号： G01B11/2513 ,  A61C9/0053 ,  A61C9/006 ,  G01B11/24 ,  G01B11/25 ,  G01B11/2518 ,  G01B11/303 ,  G01S17/08 ,  G02B3/0056 ,  G02B21/0028 ,  G02B21/006 ,  G02B23/2461 ,  G02B23/26

摘要： An apparatus is described for measuring surface topography of a three-dimensional structure. In many embodiments, the apparatus is configured to focus each of a plurality of light beams to a respective fixed focal position relative to the apparatus. The apparatus measures a characteristic of each of a plurality of returned light beams that are generated by illuminating the three-dimensional structure with the light beams. The characteristic is measured for a plurality of different positions and/or orientations between the apparatus and the three-dimensional structure. Surface topography of the three-dimensional structure is determined based at least in part on the measured characteristic of the returned light beams for the plurality of different positions and/or orientations between the apparatus and the three-dimensional structure.