公开(公告)号：US20240230327A1

公开(公告)日：2024-07-11

申请号：US18403224

申请日：2024-01-03

Applicant: MITUTOYO CORPORATION

Inventor： Toshihisa TAKAI ,  Kentaro TAMURA ,  Yasushi UESHIMA

IPC: G01C3/02 ,  G01C25/00

CPC classification number: G01C3/02 ,  G01C25/00

Abstract: A non-contact probe includes: a light irradiating section that scans a measurement target object with spot-like laser beam; an image-capturing section that captures an image of the laser beam reflected by the measurement target object by using a plurality of pixel columns selected from a light-reception surface including a plurality of pixel columns, and generates a captured image; a position sensing section that senses an image-formation position of the laser beam on the captured image; and a pixel column changing section that selects a different plurality of pixel columns such that the image-formation position is included in the selected plurality of pixel columns.