公开(公告)号：US20230333762A1

公开(公告)日：2023-10-19

申请号：US17721555

申请日：2022-04-15

Applicant: Micron Technology, Inc.

Inventor： Robert Mason ,  Pitamber Shukla ,  Scott Anthony Stoller ,  Stuart A. Bell ,  Dennis J. Borgonos

IPC: G06F3/06

CPC classification number: G06F3/064 ,  G06F3/0619 ,  G06F3/0653 ,  G06F3/0679

Abstract: A failure of a block among a set of blocks of a memory device of a memory subsystem is detected. Based on detecting the failure of the block, the block is evaluated for reuse. The block is designated for reuse based on a result of the evaluating of the block. The block is allocated to a task based on the block being designated for reuse.

公开(公告)号：US12229024B2

公开(公告)日：2025-02-18

申请号：US18608652

申请日：2024-03-18

Applicant: Micron Technology, Inc.

Inventor： Robert Mason ,  Scott A. Stoller ,  Pitamber Shukla ,  Kenneth W. Marr ,  Chi Ming Chu ,  Hossein Afkhami

IPC: G06F11/14 ,  G06F9/30

Abstract: Exemplary methods, apparatuses, and systems including memory self-recovery management to correct failures due to soft-error rate events. The self-recovery manager detects a failure of a memory device. The self-recovery manager retrieves a set of register values from the memory device. The self-recovery manager stores the set of register values from the memory device. The self-recovery manager issues a reset command to the memory device, the reset command including generating a re-initialized set of register values. The self-recovery manager compares the set of register values with the re-initialized set of register values. The self-recovery manager triggering a self-recovery attempt using the comparison of the set of register values with the re-initialized set of register values.

公开(公告)号：US20240220375A1

公开(公告)日：2024-07-04

申请号：US18608652

申请日：2024-03-18

Applicant: Micron Technology, Inc.

Inventor： Robert Mason ,  Scott A. Stoller ,  Pitamber Shukla ,  Kenneth W. Marr ,  Chi Ming Chu ,  Hossein Afkhami

IPC: G06F11/14 ,  G06F9/30

CPC classification number: G06F11/1471 ,  G06F9/30098 ,  G06F11/1469

Abstract: Exemplary methods, apparatuses, and systems including memory self-recovery management to correct failures due to soft-error rate events. The self-recovery manager detects a failure of a memory device. The self-recovery manager retrieves a set of register values from the memory device. The self-recovery manager stores the set of register values from the memory device. The self-recovery manager issues a reset command to the memory device, the reset command including generating a re-initialized set of register values. The self-recovery manager compares the set of register values with the re-initialized set of register values. The self-recovery manager triggering a self-recovery attempt using the comparison of the set of register values with the re-initialized set of register values.

公开(公告)号：US11966303B2

公开(公告)日：2024-04-23

申请号：US17877779

申请日：2022-07-29

Applicant: Micron Technology, Inc.

Inventor： Robert Mason ,  Scott A. Stoller ,  Pitamber Shukla ,  Kenneth W. Marr ,  Chi Ming Chu ,  Hossein Afkhami

IPC: G06F11/14 ,  G06F9/30

CPC classification number: G06F11/1471 ,  G06F9/30098 ,  G06F11/1469

Abstract: Exemplary methods, apparatuses, and systems including memory self-recovery management to correct failures due to soft-error rate events. The self-recovery manager detects a failure of a memory device. The self-recovery manager retrieves a set of register values from the memory device. The self-recovery manager stores the set of register values from the memory device. The self-recovery manager issues a reset command to the memory device, the reset command including generating a re-initialized set of register values. The self-recovery manager compares the set of register values with the re-initialized set of register values. The self-recovery manager triggering a self-recovery attempt using the comparison of the set of register values with the re-initialized set of register values.

公开(公告)号：US20230393955A1

公开(公告)日：2023-12-07

申请号：US17877779

申请日：2022-07-29

Applicant: Micron Technology, Inc.

Inventor： Robert Mason ,  Scott A. Stoller ,  Pitamber Shukla ,  Kenneth W. Marr ,  Chi Ming Chu ,  Hossein Afkhami

IPC: G06F11/14 ,  G06F9/30

CPC classification number: G06F11/1471 ,  G06F9/30098 ,  G06F11/1469

Abstract: Exemplary methods, apparatuses, and systems including memory self-recovery management to correct failures due to soft-error rate events. The self-recovery manager detects a failure of a memory device. The self-recovery manager retrieves a set of register values from the memory device. The self-recovery manager stores the set of register values from the memory device. The self-recovery manager issues a reset command to the memory device, the reset command including generating a re-initialized set of register values. The self-recovery manager compares the set of register values with the re-initialized set of register values. The self-recovery manager triggering a self-recovery attempt using the comparison of the set of register values with the re-initialized set of register values.