公开(公告)号：US20240053924A1

公开(公告)日：2024-02-15

申请号：US17887366

申请日：2022-08-12

Applicant: Micron Technology, Inc.

Inventor： Vinay Sandeep ,  Sanandan Sharma ,  Amit Bhardwaj ,  Prashanth Reddy Enukonda

IPC: G06F3/06

CPC classification number: G06F3/0659 ,  G06F3/0656 ,  G06F3/0619 ,  G06F3/0679

Abstract: A method includes issuing a program command to a logic unit (LUN) of a memory device, writing a plurality of commands to a transfer queue within the memory device, detecting a program failure for the LUN of the memory device, and maintaining a number of the plurality of commands in the transfer queue.