PARTICULATE OBSERVATION DEVICE AND PARTICULATE OBSERVATION METHOD

    公开(公告)号:US20210055197A1

    公开(公告)日:2021-02-25

    申请号:US17051835

    申请日:2019-08-30

    IPC分类号: G01N15/02

    摘要: The purpose of the present invention is to provide a particulate observation device using light scattering, which includes a means for determining the three-dimensional position of a particle, and can measure an accurate particle size or impart various properties of same. The present invention is characterized by including a position determination means which captures, with an optical microscope, an image of light scattered from particles in a dispersion medium to which laser light is emitted, and determines a three-dimensional position of each particle from the obtained two dimensional image, wherein the position determination obtains two-dimensional coordinates along the two-dimensional image from luminescent point positions of the particles, and determines the depth position along a coordinate axis vertical to the two-dimensional image from the diameters of diffraction fringes of the luminescent points.

    Particulate observation device and particulate observation method

    公开(公告)号:US11415500B2

    公开(公告)日:2022-08-16

    申请号:US17051835

    申请日:2019-08-30

    IPC分类号: G01N15/02 G06T7/55

    摘要: The purpose of the present invention is to provide a particulate observation device using light scattering, which includes a means for determining the three-dimensional position of a particle, and can measure an accurate particle size or impart various properties of same. The present invention is characterized by including a position determination means which captures, with an optical microscope, an image of light scattered from particles in a dispersion medium to which laser light is emitted, and determines a three-dimensional position of each particle from the obtained two dimensional image, wherein the position determination obtains two-dimensional coordinates along the two-dimensional image from luminescent point positions of the particles, and determines the depth position along a coordinate axis vertical to the two-dimensional image from the diameters of diffraction fringes of the luminescent points.