公开(公告)号：US11803456B2

公开(公告)日：2023-10-31

申请号：US17464419

申请日：2021-09-01

Applicant: NATIONAL INSTRUMENTS CORPORATION

Inventor： Sundeep Chandhoke ,  Gururaja Kasanadi Ramachandra ,  Rajaramm Chokkalingam Malarvizhy ,  Varun Mehra ,  Bjoern Bachmann

IPC: G06F9/44 ,  G06F11/273 ,  G06F11/22

CPC classification number: G06F11/2733 ,  G06F11/2242

Abstract: Methods and computing devices for allocating test pods to a distributed computing system for executing a test plan on a device-under-test (DUT). Each test pod may include a test microservice including one or more test steps and an event microservice specifying function relations between the test microservice and other test microservices. The test pods are allocated to different servers to perform a distributed execution of the test plan on the DUT through one or more test interfaces.

公开(公告)号：US20230063629A1

公开(公告)日：2023-03-02

申请号：US17464419

申请日：2021-09-01

Applicant: NATIONAL INSTRUMENTS CORPORATION

Inventor： Sundeep Chandhoke ,  Gururaja Kasanadi Ramachandra ,  Rajaramm Chokkalingam Malarvizhy ,  Varun Mehra ,  Bjoern Bachmann

IPC: G06F11/273 ,  G06F11/22

Abstract: Methods and computing devices for allocating test pods to a distributed computing system for executing a test plan on a device-under-test (DUT). Each test pod may include a test microservice including one or more test steps and an event microservice specifying function relations between the test microservice and other test microservices. The test pods are allocated to different servers to perform a distributed execution of the test plan on the DUT through one or more test interfaces.