公开(公告)号：US11569888B1

公开(公告)日：2023-01-31

申请号：US17395062

申请日：2021-08-05

Applicant: NOKIA TECHNOLOGIES OY

Inventor： Alperen Gundogan ,  Ingo Viering ,  Ahmad Awada ,  Jedrzej Stanczak ,  Christian Rom ,  Halit Murat Gursu ,  Panagiotis Spapis

IPC: H04L5/12 ,  H04B7/06 ,  H04B17/15 ,  H04B17/29

Abstract: Systems, methods, apparatuses, and computer program products for improving measurement accuracy for multipanel UEs with a single baseband unit are provided. One method may include receiving, by a user equipment, at least one of at least one layer 3 filter time constant Tcst_x, or at least one scaling factor, and updating, by the user equipment, at least one current filter time constant according to at least one of the received Tcst_x, or the at least one scaling factor.