专利检索 ap:("Nokia Solutions AND Networks Oy") AND inv:"Kiran Patel" 第 1 页

1.

发明公开
Increasing the Robustness of Electronic Systems against SEU and other Radiation Effects 审中-公开

公开(公告)号：US20240152416A1

公开(公告)日：2024-05-09

申请号：US17979940

申请日：2022-11-03

申请人： Nokia Solutions and Networks Oy

发明人： Luis Angel Maestro Ruiz De Temino , Jerzy Kolek , Slawomir Cichon , Pratibha Gupta , Gustav Derkits , Kiran Patel

IPC分类号： G06F11/00 , G06N7/00

CPC分类号： G06F11/004 , G06F11/008 , G06N7/005 , G06F2201/805

摘要： An electronic device fetches first information from memory devices concerning errors associated with radiation effects in the memory devices and fetches second information about system performance associated with the electronic device. The electronic device monitors current parameters of the memory devices and calculates parameter values for configuration of the memory devices based on the fetched first information, the fetched second information, and the monitored current parameters, the calculating performed to adjust the parameter values to improve a metric of the system performance against the errors associated with the radiation. The electronic device implements the calculated parameter values for the configuration of the memory devices.