MM-WAVE SFCW RADAR AND SAF BASED IMAGING INSPECTION SYSTEM

    公开(公告)号:US20180196134A1

    公开(公告)日:2018-07-12

    申请号:US15864103

    申请日:2018-01-08

    Applicant: OZ Optics Ltd.

    Abstract: The present invention presents a flexible, stepped frequency, radar based, imaging inspection system. The imaging inspection system can be used in airports, seaport sites, borders, postal processing centres, and sensitive sites. It comprises a millimetre-wave Stepped Frequency Continuous Wave (SFCW) radar module (2) connected to a transmitting channel and a receiving channel. The transmitting channel may comprise a frequency upconvertor (8) and the receiving channel may comprise a frequency downconvertor (10). A digital signal processing unit (14) reconstructs a conductivity profile and a permittivity profile of an object under test (OUT) from measurement data collected via a phase-array antenna or a translational stage (18) based on synthetic aperture focusing (SAF).

    MM-wave SFCW radar and SAF based imaging inspection system

    公开(公告)号:US10782404B2

    公开(公告)日:2020-09-22

    申请号:US15864103

    申请日:2018-01-08

    Applicant: OZ Optics Ltd.

    Abstract: The present invention presents a flexible, stepped frequency, radar based, imaging inspection system. The imaging inspection system can be used in airports, seaport sites, borders, postal processing centres, and sensitive sites. It comprises a millimetre-wave Stepped Frequency Continuous Wave (SFCW) radar module (2) connected to a transmitting channel and a receiving channel. The transmitting channel may comprise a frequency upconvertor (8) and the receiving channel may comprise a frequency downconvertor (10). A digital signal processing unit (14) reconstructs a conductivity profile and a permittivity profile of an object under test (OUT) from measurement data collected via a phase-array antenna or a translational stage (18) based on synthetic aperture focusing (SAF).

    MULTI-VIEW PLANAR NEAR-FIELD SCATTERING TOMOGRAPHY SYSTEM

    公开(公告)号:US20180074103A1

    公开(公告)日:2018-03-15

    申请号:US15699051

    申请日:2017-09-08

    Applicant: OZ OPTICS LTD.

    CPC classification number: G01R27/32 G01N22/00 G01R27/06 G01R29/0821

    Abstract: A multi-view planar near-field scattering tomography system is provided herein. In one aspect the system is developed based on the reformulated signal subspace approach. Utilized for solving the electromagnetic inverse scattering problem, the signal subspace approach is reformulated.The present invention pertains to a computationally efficient approach to an electromagnetic inverse scattering-based permittivity profile estimation technique.In a second aspect, the system is developed at the millimeter-wave and THz frequency range to ensure accuracy by eliminating the multipath effects and without the need for an Anechoic chamber or water as a background medium for clinical, security, and manufacturing applications.

    Multi-view planar near-field scattering tomography system

    公开(公告)号:US10768214B2

    公开(公告)日:2020-09-08

    申请号:US15699051

    申请日:2017-09-08

    Applicant: OZ Optics Ltd.

    Abstract: A multi-view planar near-field scattering tomography system is provided herein. In one aspect the system is developed based on the reformulated signal subspace approach. Utilized for solving the electromagnetic inverse scattering problem, the signal subspace approach is reformulated. The present invention pertains to a computationally efficient approach to an electromagnetic inverse scattering-based permittivity profile estimation technique. In a second aspect, the system is developed at the millimeter-wave and THz frequency range to ensure accuracy by eliminating the multipath effects and without the need for an Anechoic chamber or water as a background medium for clinical, security, and manufacturing applications.

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