公开(公告)号：US11640193B2

公开(公告)日：2023-05-02

申请号：US17485120

申请日：2021-09-24

Applicant: QUALCOMM INCORPORATED

Inventor： Kunal Desai ,  Ankit Shambhu ,  Srinivas Maddali ,  Sanjeev Shukla

IPC: G06F1/28 ,  G06F11/30 ,  G06F1/26 ,  G06F1/04 ,  G06F11/22 ,  G06F1/30

Abstract: A system-on-a-chip (“SoC”) in a computing device may be provided with a power delivery network (“PDN”) self-test to detect marginal PDN performance. In the self-test, a current surge may be generated on power supply connections of logic circuit blocks. Voltage monitors may measure voltage droop on the power supply connections responsive to the current surge. Voltage droop measurements may be compared with thresholds. An action, such as generation of an alert, may be performed if a voltage droop measurement exceeds a threshold.