公开(公告)号：US20240241189A1

公开(公告)日：2024-07-18

申请号：US18155586

申请日：2023-01-17

Applicant: Quanta Computer Inc.

Inventor： Kuo-Chan HSU ,  Yun-Teng SHIH ,  Chia-Wei LEE

IPC: G01R31/40 ,  G01R31/319 ,  G01R31/3193

CPC classification number: G01R31/40 ,  G01R31/31924 ,  G01R31/31932

Abstract: A test load circuit includes a test load, a current sensor, and comparator. The test load is connected to a voltage source of a power supply. The current sensor is configured to detect the amount of current flowing through the test load. The comparator has a first input connected to a feedback signal having a voltage associated with the test load current, a second input connected to a command signal having has a voltage associated with a target current through the test load, and an output connected to the test load. The output of the comparator has a voltage that is based on the current difference between the target current and the test load current. The test load has a variable resistance that is controllable by the output of the comparator to adjust the test load current and cause the test load current to match the target current.