METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY AND COMPLIANCE TESTING

    公开(公告)号:US20240361386A1

    公开(公告)日:2024-10-31

    申请号:US18734706

    申请日:2024-06-05

    申请人: CELERINT, LLC

    IPC分类号: G01R31/319 G01R31/3183

    摘要: A method is provided for determining a decoupling capacitance of a device under test (DUT) interface circuitry, which is between automated testing equipment (ATE) and a DUT. The method: disconnects the DUT from the DUT interface circuitry; connects a Device Under Testing Power Supply (DPS) resource as a DUT Power Supply to the DUT interface circuitry; sets a current clamp of the DPS resource to a test application level; turns off the DPS resource voltage; sets the DPS resource to a force voltage mode; sets the current clamp to a minimum current level; turns on the output; waits a period of time to allow the decoupling capacitance to charge; places the DPS resource into a voltage measurement mode; adds any delay time to the period of time; measures the voltage before the capacitance is fully charged; and determines the decoupling capacitance.

    Multi-die debug stop clock trigger

    公开(公告)号:US11946969B2

    公开(公告)日:2024-04-02

    申请号:US17880507

    申请日:2022-08-03

    申请人: Apple Inc.

    摘要: Systems, apparatuses, and methods for implementing a multi-die clock stop trigger are described. A computing system includes a plurality of semiconductor dies connected together and sharing a global clock stop trigger signal which is pulled high via a resistor tied to a supply voltage. Each semiconductor die has a clock generation unit which generates local clocks for the die. Each clock generation unit monitors for local clock stop triggers, and if one of the local triggers is detected, the clock generation unit stops local clocks on the die and pulls the global clock stop trigger signal low. When the other clock generation units on the other semiconductor dies detect the global clock stop trigger at the logic low level, these clock generation units also stop their local clocks. Captured data is then retrieved from the computing system for further analysis.

    125V SWITCH GLITCH MITIGATION
    4.
    发明公开

    公开(公告)号:US20240036114A1

    公开(公告)日:2024-02-01

    申请号:US18038638

    申请日:2021-12-02

    IPC分类号: G01R31/319 G01R31/28

    CPC分类号: G01R31/31924 G01R31/2879

    摘要: A signal driver system can include one or more force amplifiers configured to provide drive signals to an output node, such as a device under test (DUT) node. The system can include a first switch circuit coupled between a first force amplifier and the output node, and the first switch circuit can include multiple parallel instances of switch circuits with respective different resistance characteristics. The system can include a second switch circuit coupled between a second force amplifier and the output node. The system can include a control circuit configured to control the switch circuit instances of the first switch circuit to mitigate glitch at the output node, for example, when switching between the first and second drive signals.

    DETERMINING CHARGE PUMP EFFICIENCY USING CLOCK EDGE COUNTING

    公开(公告)号:US20230349972A1

    公开(公告)日:2023-11-02

    申请号:US17731589

    申请日:2022-04-28

    摘要: A charge pump test configuration and corresponding method of operation are disclosed for determining charge pump efficiency without needing to obtain direct current measurements. A first number of clock edges (CEs) of a clock signal supplied to a first charge pump is determined over a period of time for a predetermined output current. The first charge pump is then connected with a charge pump under test (PUT) in a cascaded manner such that an output current of the first charge pump is supplied to the PUT as an input current. A second number of CEs of a clock signal supplied to the first charge pump is determined over the same period of time for the same predetermined output current from the PUT. The efficiency of the PUT can then be determined as the ratio of the first number of CEs to the second number of CEs, or vice versa.

    Detection system and detection method

    公开(公告)号:US11782093B2

    公开(公告)日:2023-10-10

    申请号:US17123142

    申请日:2020-12-16

    发明人: Yen-Ting Tung

    IPC分类号: G01R31/319 H04B3/54

    摘要: The present disclosure relates to a detection system including a control circuit, a power line network bridge circuit, a fixture device and a detection device. The control circuit is configured to generate a plurality of detection signals. The power line network bridge circuit receives detection signals through a power line. The fixture device is electrically connected to the power line through the power line network bridge, and is configured to receive the detection signals. The fixture device is configured to transmit the detection signals to a device under test, so that the device under test displays a plurality of media. The detection device is configured to capture the media and transmit the media to the control circuit. The control circuit is further configured to determine whether the media match with detection parameters.

    Signal generator and a method for controlling the signal generator

    公开(公告)号:US11762016B2

    公开(公告)日:2023-09-19

    申请号:US17457972

    申请日:2021-12-07

    摘要: A signal generator and a method for controlling the signal generator, capable of suppressing variation in the intensity of signals inputted to multiple devices under test are provided. An attenuation amount setting unit 15 sets a reference attenuation amount, obtained by subtracting the maximum amount of the losses stored in the cable loss storage unit 16 with respect to the cables 4a to 4f connected to the output ports 12a to 12f from a target attenuation amount, to the first attenuator 11, and sets an output attenuation amount, obtained by subtracting the losses stored in the cable loss storage unit 16 with respect to each of the cables 4a to 4f connected to the output ports 12a to 12f, from the maximum amount of the losses, to each of the second attenuators 14a to 14f.

    OUTPUT VOLTAGE COMPENSATION METHOD
    8.
    发明公开

    公开(公告)号:US20230251313A1

    公开(公告)日:2023-08-10

    申请号:US18088792

    申请日:2022-12-27

    申请人: Chih-Huan FANG

    发明人: Chih-Huan FANG

    IPC分类号: G01R31/319 G01R19/00

    CPC分类号: G01R31/31924 G01R19/0092

    摘要: The present invention provides an output voltage compensation method, for a DC voltage source having a constant voltage circuit and a constant current circuit connected in series, and the DC voltage source provides an output voltage to a device under test (DUT), and the output voltage compensation method comprising: generating a voltage compensation value according to a load current and a gain parameter of the DUT; generating a virtual current setting value according to a voltage setting value and the voltage compensation value; generating a duty cycle command according to the virtual current setting value and a load current measurement value of the load current; and generating the output voltage conforming to the voltage setting value according to the duty cycle command. Wherein the gain parameter is related to a multiplier parameter of the constant voltage circuit.