公开(公告)号：US20150028188A1

公开(公告)日：2015-01-29

申请号：US13951748

申请日：2013-07-26

Applicant: Raytheon Company

Inventor： Andrew M. Kowalevicz ,  Frank Allen Birdsong, JR.

IPC: H01L27/146

CPC classification number: H01L27/14625 ,  G02B5/26

Abstract: A non-retro-reflective imaging system and methods in which tilted image plane imaging is combined with selective Fourier filtering to substantially eliminate retro-reflection from the system. In certain examples, tilted image plane imaging is achieved using sliced source imaging. Through rotation of the image plane, the majority of incident light is reflected off-axis, rather than being retro-reflected. The Fourier filter is used to block incoming light from a particular angle that would otherwise be normally incident on the rotated image plane and retro-reflected. One example of a non-retro-reflective imaging system includes an optical element that focuses electromagnetic radiation onto a tilted image plane, an imaging sensor co-aligned with the tilted image plane, and a Fourier filter positioned in a Fourier plane of the optical element, a position of the Fourier filter in the Fourier plane determined by the tilt angle of the tilted image plane.

Abstract translation: 非反光成像系统和倾斜图像平面成像与选择性傅里叶滤波组合以基本上消除来自系统的反射的方法。 在某些示例中，使用切片源成像来实现倾斜图像平面成像。 通过图像平面的旋转，大部分入射光被反射离轴，而不是被反射。 傅立叶滤波器用于阻挡来自特定角度的入射光，否则其将正常地入射到旋转的图像平面上并进行反射。 非逆反射成像系统的一个示例包括将电磁辐射聚焦到倾斜图像平面上的光学元件，与倾斜图像平面共同对准的成像传感器和位于光学元件的傅立叶平面中的傅立叶滤波器 由傅里叶平面中的傅立叶滤波器的位置由倾斜图像平面的倾斜角确定。

公开(公告)号：US20150146050A1

公开(公告)日：2015-05-28

申请号：US14089802

申请日：2013-11-26

Applicant: RAYTHEON COMPANY

Inventor： Andrew M. Kowalevicz ,  Frank Allen Birdsong, JR.

IPC: H04N5/30 ,  G02B13/00

CPC classification number: H04N5/30 ,  G02B13/00 ,  G02B27/0018 ,  H04N5/2254 ,  H04N5/2258

Abstract: Imaging systems and methods for simultaneous real and Fourier plane imaging. In one example, an imaging system includes at least one optical element configured to receive and focus incident electromagnetic radiation from a viewed scene, a first detector positioned at an image plane of the at least one optical element and configured to produce a first image of the viewed scene, and a second detector positioned at a Fourier plane of the at least one optical element and configured to produce a second image of the viewed scene, the first and second detectors configured to receive the electromagnetic radiation and produce the first and second images, respectively. The system may additionally include an optical component, such as a beamsplitter, for example, configured to divide and direct the incident electromagnetic radiation to the first and second detectors.

Abstract translation: 用于同时实时和傅里叶平面成像的成像系统和方法。 在一个示例中，成像系统包括至少一个光学元件，其被配置为接收并聚焦来自所观看场景的入射电磁辐射，第一检测器位于所述至少一个光学元件的像平面处，并被配置为产生所述第一图像 以及位于所述至少一个光学元件的傅立叶平面处并被配置为产生所述观看场景的第二图像的第二检测器，所述第一和第二检测器被配置为接收所述电磁辐射并产生所述第一和第二图像， 分别。 该系统可以另外包括诸如分束器的光学部件，例如，被配置为将入射的电磁辐射分割并引导到第一和第二检测器。

公开(公告)号：US20140166854A1

公开(公告)日：2014-06-19

申请号：US13714637

申请日：2012-12-14

Applicant: RAYTHEON COMPANY

Inventor： Andrew Kowalevicz ,  Frank Allen Birdsong, JR.

IPC: G01J1/42

CPC classification number: G01S3/784 ,  F41G3/14 ,  G01S5/16 ,  G01S7/4804 ,  G02B5/128 ,  H04N5/00

Abstract: Methods and apparatus for covert detection of an interrogating device. In one example a method includes receiving an interrogation beam at an optical system, imaging a scene including a source of the interrogation beam without retro-reflecting the interrogation beam to produce an image, and analyzing the image to determine an approximate location of the source within the scene. In some examples, a threat detection sensor is used to further analyze the interrogation beam to determine information about the interrogating device.

Abstract translation: 用于秘密检测询问装置的方法和装置。 在一个示例中，一种方法包括在光学系统处接收询问光束，对包括询问光源的场景进行成像，而不回复询问光束以产生图像，并且分析图像以确定源的近似位置 现场。 在一些示例中，使用威胁检测传感器来进一步分析询问光束以确定关于询问设备的信息。