PACKAGED INTEGRATED DEVICE
    1.
    发明公开

    公开(公告)号:US20230420356A1

    公开(公告)日:2023-12-28

    申请号:US18218280

    申请日:2023-07-05

    Applicant: Rambus Inc.

    CPC classification number: H01L23/49838 H01L23/49816

    Abstract: Disclosed is an integrated circuit die of a memory buffer integrated circuit that is placed aggregately closer to the solder balls that connect to the input (i.e., host command/address—C/A) signals than the output solder balls (i.e., memory device C/A) signals. This decreases the length of the host C/A signals from the memory controller to the memory buffer device when the memory module is placed in a system.

    SIGNAL SKEW IN SOURCE-SYNCHRONOUS SYSTEM

    公开(公告)号:US20220059154A1

    公开(公告)日:2022-02-24

    申请号:US17309770

    申请日:2019-12-11

    Applicant: Rambus Inc.

    Abstract: A memory controller integrated circuit includes a clock signal generator circuit configured to generate a plurality of strobe signals. The memory controller integrated circuit further includes a memory interface circuit coupled to the clock signal generator circuit, the memory interface circuit configured to transmit the plurality of strobe signals to a memory module, wherein each of the plurality of strobe signals is offset with respect to an adjacent strobe signal, and transmit a plurality of data signals to the memory module, wherein a first subset of the plurality of data signals comprises a first nibble and is phase aligned with a first strobe signal of the plurality of strobe signals, and wherein a second subset of the plurality of data signals comprises a second nibble and is phase aligned with a second strobe signal of the plurality of strobe signals.

    SIGNAL SKEW IN SOURCE-SYNCHRONOUS SYSTEM

    公开(公告)号:US20240395310A1

    公开(公告)日:2024-11-28

    申请号:US18673246

    申请日:2024-05-23

    Applicant: Rambus Inc.

    Abstract: A memory controller integrated circuit includes a clock signal generator circuit configured to generate a plurality of strobe signals. The memory controller integrated circuit further includes a memory interface circuit coupled to the clock signal generator circuit, the memory interface circuit configured to transmit the plurality of strobe signals to a memory module, wherein each of the plurality of strobe signals is offset with respect to an adjacent strobe signal, and transmit a plurality of data signals to the memory module, wherein a first subset of the plurality of data signals comprises a first nibble and is phase aligned with a first strobe signal of the plurality of strobe signals, and wherein a second subset of the plurality of data signals comprises a second nibble and is phase aligned with a second strobe signal of the plurality of strobe signals.

    PACKAGED INTEGRATED DEVICE
    4.
    发明申请

    公开(公告)号:US20210305142A1

    公开(公告)日:2021-09-30

    申请号:US17264231

    申请日:2019-08-12

    Applicant: Rambus Inc.

    Abstract: Disclosed is an integrated circuit die of a memory buffer integrated circuit that is placed aggregately closer to the solder balls that connect to the input (i.e., host command/address—C/A) signals than the output solder balls (i.e., memory device C/A) signals. This decreases the length of the host C/A signals from the memory controller to the memory buffer device when the memory module is placed in a system.

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