公开(公告)号：US20160266273A1

公开(公告)日：2016-09-15

申请号：US14645666

申请日：2015-03-12

Applicant: Raytheon Company

Inventor： James A. Wurzbach ,  Kalin Spariosu ,  Bernard Harris ,  Eric J. Griffin

IPC: G01V5/00 ,  G01N23/203 ,  G01B15/00

CPC classification number: G01V5/0025 ,  G01B15/04 ,  G01N23/203

Abstract: A method, apparatus and system for profiling a material composition of a volume is disclosed. A beam source directs a pulsed beam of electromagnetic energy from into the volume. A plurality of backscattered beams is received at a detector. The plurality of backscattered beams is generated from a plurality of depths within the volume in response to interactions of the directed pulsed beam at the plurality of depths. A processor performs range gating of the plurality of backscattered beams to obtain a depth profile of backscattered intensity within the volume and estimates a material composition at different depths of the volume from the generated depth profile.

Abstract translation: 公开了一种用于分析体积的材料组成的方法，装置和系统。 光束源将脉冲的电磁能束射入体积。 在检测器处接收多个后向散射光束。 响应于在多个深度处的定向脉冲光束的相互作用，多个后向散射光束从体积内的多个深度产生。 处理器执行多个后向散射光束的范围选通以获得体积内的后向散射强度的深度分布，并且估计体积与生成的深度分布的不同深度处的材料组成。

公开(公告)号：US10126459B2

公开(公告)日：2018-11-13

申请号：US14645666

申请日：2015-03-12

Applicant: Raytheon Company

Inventor： James A. Wurzbach ,  Kalin Spariosu ,  Bernard Harris ,  Eric J. Griffin

IPC: G01V5/00 ,  G01N23/203 ,  G01B15/04

Abstract: A method, apparatus and system for profiling a material composition of a volume is disclosed. A beam source directs a pulsed beam of electromagnetic energy from into the volume. A plurality of backscattered beams is received at a detector. The plurality of backscattered beams is generated from a plurality of depths within the volume in response to interactions of the directed pulsed beam at the plurality of depths. A processor performs range gating of the plurality of backscattered beams to obtain a depth profile of backscattered intensity within the volume and estimates a material composition at different depths of the volume from the generated depth profile.

公开(公告)号：US20220128409A1

公开(公告)日：2022-04-28

申请号：US17081047

申请日：2020-10-27

Applicant: Raytheon Company

Inventor： Richard Moro, JR. ,  Erik D. Johnson ,  Bernard Harris ,  Jeffrey R. Laroche

IPC: G01J3/44 ,  G01N21/65

Abstract: Disclosed herein are Raman spectrographic systems and methods of assembling Raman spectrographic systems. The Raman spectrographic system includes a light source to emit ultraviolet incident light into a waveguide, and an interaction region traversed by the waveguide and that holds a sample to be identified. A spectrometer detects Raman scatter from an output light in the waveguide emerging from the interaction region following interaction between the incident light and the sample and output a spectral response. The spectrometer includes an array of detectors. Each detector of the array of detectors is a silicon carbide (SiC) detector to obtain information that includes an intensity corresponding with a wavelength of the Raman scatter. A controller identifies the sample based on the spectral response from the array of detectors.