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公开(公告)号:US20220311424A1
公开(公告)日:2022-09-29
申请号:US17702482
申请日:2022-03-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: JUSUNG LEE , WOOSEOK KIM , TAEIK KIM , CHANYOUNG JEONG
Abstract: A bandgap reference circuit includes a reference current generation circuit configured to output a bandgap reference current insensitive to a temperature change, by using a first voltage inversely proportional to temperature and a third voltage proportional to temperature. The third voltage is a difference between the first voltage and a second voltage. The bandgap reference circuit further includes a resistivity temperature coefficient cancellation circuit configured to remove a first current proportional to temperature from the bandgap reference current by using the third voltage, and a reference voltage generation circuit configured to output a bandgap reference voltage insensitive to a temperature change by using a second current inversely proportional to temperature and a first resistance proportional to temperature. The second current is generated by removing the first current from the bandgap reference current.
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2.
公开(公告)号:US20230152775A1
公开(公告)日:2023-05-18
申请号:US17721502
申请日:2022-04-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: JUHO YANG , HEESOO PARK , JOUNGTAEK YOON , WONGEUN LEE , JUSUNG LEE
IPC: G05B19/406 , H04L67/12
CPC classification number: G05B19/406 , H04L67/12 , G05B2219/37206 , H01L21/67733
Abstract: A transport device inspection system includes a plurality of transport devices configured to move along a transport path, a diagnostic server configured to create inspection schedule information for the plurality of transport devices, an inspector configured to receive the inspection schedule information from the diagnostic server and to sequentially inspect the plurality of transport devices in accordance with the inspection schedule information, and a transport device controller configured to receive the inspection schedule information from the inspector and to control the plurality of transport devices to sequentially move to an inspection position in accordance with the inspection schedule information.
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