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公开(公告)号:US20200147998A1
公开(公告)日:2020-05-14
申请号:US16672749
申请日:2019-11-04
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Wonjun CHOI , Jaewook LEE , Jongsik WON , Jaewon YOO , Jungdae HEO , Seungbohm HONG
Abstract: An omni-directional wheel includes: a center wheel configured to rotate about a first rotation axis extending in a first direction; a plurality of peripheral wheels arranged along a circumference of the center wheel and configured to rotate about a second rotation axis extending in a second direction different from the first direction; and a plurality of variable supports provided on the center wheel and configured to respectively support the plurality of peripheral wheels. At least one of the plurality of variable supports is configured to absorb, when an impact force is applied to at least one of the plurality of peripheral wheels being supported by the at least one of the plurality of variable supports, the impact by changing a distance between the center wheel and the at least one of the plurality of peripheral wheels.
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公开(公告)号:US20250130268A1
公开(公告)日:2025-04-24
申请号:US18920172
申请日:2024-10-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Chunghyun KIM , Changsuk OH , Kiyoung JEON , Jaewon YOO , Myoungsuk JANG , Kwanghwa LEE , Seokjae HONG
Abstract: A semiconductor test apparatus includes a base plate, side supporters provided as three or more on a lower surface of the base plate, an elastic cylinder and a side stopper provided on a lower surface of each of the side supporters, a center stopper provided laterally apart from the side supporters on the lower surface of the base plate, a stopper foot provided at one end of the center stopper, a foot supporter provided at one end of the stopper foot, a top plate disposed under the base plate to contact the elastic cylinder and the side stopper, the top plate including a center hole in a center portion thereof, and a substrate cover provided under the top plate, wherein the center stopper and the side stopper are selectively locked.
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