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公开(公告)号：US10295563B2
公开(公告)日：2019-05-21
申请号：US14716344
申请日：2015-05-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Mi-so Kim , Jong-won Han
Abstract: Provided are a test socket for a semiconductor device and a test device including the test socket. The test device includes a test socket including terminals arranged in a two-dimensional array and corresponding to terminals of the semiconductor device and a ground line extending along at least one row of two-dimensional array; and a substrate electrically connected to the test socket so as to transmit and receive a test signal. The test socket includes a ground line extending along at least one row of the two-dimensional array.
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