公开(公告)号：US20220357290A1

公开(公告)日：2022-11-10

申请号：US17622535

申请日：2020-06-24

Applicant: SMS group GmbH ,  IMS Messsysteme GmbH

Inventor： Christian KLINKENBERG ,  Ulrich SOMMERS ,  Helmut KLEIN ,  Alexandre LHOEST ,  Olivier PENSIS ,  Horst KRAUTHÄUSER

IPC: G01N23/20008

Abstract: A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.

公开(公告)号：US20190292624A1

公开(公告)日：2019-09-26

申请号：US16304626

申请日：2017-05-24

Applicant: SMS GROUP GMBH

Inventor： Mostafa BIGLARI ,  Ulrich SOMMERS ,  Christian KLINKENBERG ,  Michel RENARD ,  Guy RAYMOND ,  Oliver PENSIS ,  Tobias TERLAU ,  Horst KRAUTHÄUSER

IPC: C21D9/56 ,  C21D11/00 ,  G01N23/20008

Abstract: A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.