公开(公告)号：US11415405B2

公开(公告)日：2022-08-16

申请号：US16858110

申请日：2020-04-24

Applicant: STMicroelectronics Asia Pacific Pte Ltd

Inventor： Sa Hyang Hong ,  Jun Hwan Kang ,  Yun Sang On

IPC: G06F3/041 ,  G01B7/16 ,  G01L1/22

Abstract: Disclosed herein is a strain gauge including a substrate, with a first Wheatstone bridge arrangement of resistors disposed on a first surface of the substrate, and a second Wheatstone bridge arrangement of resistors disposed remotely from the first Wheatstone bridge arrangement of resistors. The resistors of the first Wheatstone bridge arrangement are equal in resistance to one another, while the resistors of the second Wheatstone bridge arrangement are unequal in resistance to one another and unequal to those of the first Wheatstone bridge arrangement. The first Wheatstone bridge arrangement of resistors are electrically connected in parallel with the second Wheatstone bridge arrangement of resistors such that each resistor of the first Wheatstone bridge arrangement is electrically connected in parallel with a different resistor of the second Wheatstone bridge arrangement.