公开(公告)号：US09015539B2

公开(公告)日：2015-04-21

申请号：US13969259

申请日：2013-08-16

Applicant: STMicroelectronics International N.V.

Inventor： Suraj Prakash

IPC: G11C29/00 ,  G11C29/10 ,  G11C29/50 ,  G11C17/00 ,  G11C29/04

CPC classification number: G11C29/10 ,  G11C17/00 ,  G11C29/50 ,  G11C2029/0401

Abstract: A method for identifying non stuck-at faults in a read-only memory (ROM) includes generating a golden value of a victim cell, providing a fault-specific pattern through an aggressor cell, generating a test reading of the victim cell in response to the provided fault-specific pattern, and determining whether the ROM has at least one non stuck-at fault. The determination is based on a comparison of the golden value and the test reading of the victim cell.

Abstract translation: 用于识别只读存储器（ROM）中的非卡住故障的方法包括生成受害单元的金值，通过侵略者单元提供故障特定模式，响应于 提供的故障特定模式，以及确定ROM是否具有至少一个非卡住故障。 确定是基于对受害者细胞的黄金值和测试读数的比较。

公开(公告)号：US20130332785A1

公开(公告)日：2013-12-12

申请号：US13969259

申请日：2013-08-16

Applicant: STMicroelectronics International N.V.

Inventor： Suraj Prakash

IPC: G11C29/10

CPC classification number: G11C29/10 ,  G11C17/00 ,  G11C29/50 ,  G11C2029/0401

Abstract: A method for identifying non stuck-at faults in a read-only memory (ROM) includes generating a golden value of a victim cell, providing a fault-specific pattern through an aggressor cell, generating a test reading of the victim cell in response to the provided fault-specific pattern, and determining whether the ROM has at least one non stuck-at fault. The determination is based on a comparison of the golden value and the test reading of the victim cell.

Abstract translation: 用于识别只读存储器（ROM）中的非卡住故障的方法包括生成受害单元的金值，通过侵略者单元提供故障特定模式，响应于 提供的故障特定模式，以及确定ROM是否具有至少一个非卡住故障。 确定是基于对受害者细胞的黄金值和测试读数的比较。