IGBT TRANSISTOR WITH PROTECTION AGAINST PARASITIC COMPONENT ACTIVATION AND MANUFACTURING PROCESS THEREOF
    1.
    发明申请
    IGBT TRANSISTOR WITH PROTECTION AGAINST PARASITIC COMPONENT ACTIVATION AND MANUFACTURING PROCESS THEREOF 有权
    具有防止PARASITIC分量激活的保护的IGBT晶体管及其制造工艺

    公开(公告)号:US20140134807A1

    公开(公告)日:2014-05-15

    申请号:US14162200

    申请日:2014-01-23

    CPC classification number: H01L29/66333 H01L29/1095 H01L29/66325 H01L29/7395

    Abstract: An IGBT transistor includes a drift region, at least one body region housed in the drift region and having a first type of conductivity, and a conduction region, which crosses the body region in a direction perpendicular to a surface of the drift region and has the first type of conductivity and a lower resistance than the body region. The conduction region includes a plurality of implant regions, arranged at respective depths from the surface of the drift region.

    Abstract translation: IGBT晶体管包括漂移区域,容纳在漂移区域中并且具有第一类型的导电性的至少一个体区和在垂直于漂移区域的表面的方向上穿过身体区域的导电区域,并且具有 第一类导电性和比身体区域更低的电阻。 导电区域包括多个植入区域,其布置在距漂移区域的表面相应的深度处。

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