公开(公告)号：US12222294B2

公开(公告)日：2025-02-11

申请号：US17737663

申请日：2022-05-05

Applicant: Samsung Display Co., LTD.

Inventor： Jeong Moon Lee ,  Dae Hong Kim ,  Hyung Jin Lee

IPC: G01N21/88 ,  G01N21/31 ,  G01N21/33 ,  G01N21/35 ,  G01N21/84 ,  G01N21/94 ,  G01N21/95

Abstract: An optical inspection device includes: a barrel; a first light source unit at a first side of the barrel and configured to irradiate light of a first wavelength range through a first light path; a second light source unit at a second side of the barrel, the second side being different from the first side, and configured to irradiate light of a second wavelength range that is different from the first wavelength range through a second light path; and a camera. At least a portion of the first light path is different from the second light path.

公开(公告)号：US11328637B2

公开(公告)日：2022-05-10

申请号：US16593402

申请日：2019-10-04

Applicant: Samsung Display Co., Ltd.

Inventor： Dae Hong Kim ,  Hyungjin Lee ,  Sung Hoon Yang ,  Se Yoon Oh

IPC: G06K9/00 ,  G09G3/00 ,  G06T7/00 ,  G01R31/28 ,  G01R19/00 ,  G06T7/70

Abstract: An inspecting device of a display panel includes a contact including first probe pins that contact to data pads of a display panel and second probe pins that contact to common voltage pads of the display panel, a signal generator coupled to the first probe pins, the signal generator configured to generate a first data voltage corresponding to a first gray level and a second data voltage corresponding to a second gray level, a power generator coupled to the second probe pins, the power generator configured to generate a first common voltage and a second common voltage of which a voltage level is different from a voltage level of the second common voltage, and a defect detector configured to detect a defect of the display panel by removing a contact noise generated due to contact failure of the first probe pins and the second probe pins.

公开(公告)号：US20190147577A1

公开(公告)日：2019-05-16

申请号：US16136094

申请日：2018-09-19

Applicant: Samsung Display Co., Ltd.

Inventor： Hyung Jin Lee ,  Dae Hong Kim ,  Sung Hoon Yang ,  Se Yoon Oh

IPC: G06T7/00 ,  G01N21/95 ,  G01N21/956

Abstract: In a device for detecting a defect, the device includes: an image pickup unit including pixels, the image pickup unit generating a substrate image by picking up an image of a substrate having patterns formed on a top surface thereof; and a controller for detecting a defect located on the substrate, based on the substrate image, wherein the substrate image includes pattern images corresponding to the patterns, wherein each of the pattern images includes pixel values, wherein the controller detects the defect by comparing weights of pixel values for each of the pattern images.

公开(公告)号：US11120544B2

公开(公告)日：2021-09-14

申请号：US16574332

申请日：2019-09-18

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Hyungjin Lee ,  Dae Hong Kim ,  Minjung Park ,  Sung Hoon Yang ,  Seyoon Oh

IPC: G06T7/00

Abstract: A display panel inspection system includes a camera to image respective frames of a mother substrate in a frame-by-frame manner, a stage to move the mother substrate relative to the camera, an image obtaining unit to store frames imaged by the camera, a gray level extracting unit that obtains gray level values of the frames, a frame matching unit that searches and matches two frames that match each other among the frames imaged by the camera, a correcting unit that performs correction on one of two frames matched with each other in consideration of an alignment error and an image distortion between the two frames, and a comparing unit that compares the gray level values of the two frames matched with each other, after the correction.