公开(公告)号：US20240027363A1

公开(公告)日：2024-01-25

申请号：US18120124

申请日：2023-03-10

Applicant: Samsung Display Co., Ltd.

Inventor： YUNKU KANG ,  KITAEK KIM ,  SUNGMIN PARK ,  JANGHOON LEE ,  LEEGU HAN

IPC: G01N21/95 ,  G01N21/88 ,  G01N33/38

CPC classification number: G01N21/95 ,  G01N21/8806 ,  G01N33/386 ,  G01N2021/8841

Abstract: A glass inspection equipment includes a first transfer rail extending in a first direction, where a glass including first sides and second sides extending in a direction intersecting the first sides reciprocates in the first direction, a rotation part on the first transfer rail to rotate the glass, an edge inspection part on the first transfer rail to inspect the first and second sides of the glass, and a surface inspection part which inspects a surface of the glass, the edge inspection part inspects the first sides when the glass with the first sides arranged parallel to the first direction is transferred under the edge inspection part, and the edge inspection part inspects the second sides when the glass transferred through the edge inspection part is rotated by the rotation part and the glass with the second sides parallel to the first direction is transferred under the edge inspection part.

公开(公告)号：US20250022120A1

公开(公告)日：2025-01-16

申请号：US18750111

申请日：2024-06-21

Applicant: Samsung Display Co., Ltd.

Inventor： YUNKU KANG ,  SUNGMIN PARK ,  JANGHOON LEE ,  LEEGU HAN

IPC: G06T7/00 ,  G01N21/45 ,  G01N21/88

Abstract: An automatic inspection system for detecting defects in ultra-thin glass is disclosed that includes an edge inspection module for inspecting for chipping and wedge defects caused during laser cutting of the ultra-thin glass into cell units, a surface inspection module for inspecting scratches, cracks, and foreign substances on a surface of the ultra-thin glass, a phase measurement beam deflection (PMD) module for inspecting the surface of the ultra-thin glass for smudges and depressions through phase change measurement, and a Pt-derived ultra-fine defect inspection module for inspecting the ultra-thin glass for Pt-derived ultra-fine defects.

公开(公告)号：US20230042179A1

公开(公告)日：2023-02-09

申请号：US17729344

申请日：2022-04-26

Applicant: Samsung Display Co., Ltd. ,  DIGITAL IMAGING TECHNOLOGY

Inventor： JANGHOON LEE ,  Jin Woo Kim ,  Cheol Hyun Cho ,  JAYOUNG CHO ,  LEEGU HAN

IPC: G01N21/88 ,  G01N21/958

Abstract: A system for inspecting thin glass includes: a housing including a body and a cover; a first shuttle which fixes an edge portion of the thin glass and reciprocates in a first axis direction; a first inspection part disposed on the body and which measures a position of a defect formed in the thin glass by taking a picture of the thin glass; a transport shuttle which separates the thin glass from the first shuttle, a second shuttle which separates the thin glass from the transport shuttle, fixes the thin glass, and reciprocates the upper surface of the body; and a second inspection part disposed on the body and spaced apart from the first inspection part and which inspects the position of the defect by taking an enlarged picture of the position of the defect. The first shuttle tensions and fixes the thin glass.