公开(公告)号：US20180133914A1

公开(公告)日：2018-05-17

申请号：US15869966

申请日：2018-01-12

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Kyung-Hoe HEO ,  Seung-Jun LEE

IPC: B26D3/00 ,  B26D1/01 ,  B26D3/08 ,  B26D5/00 ,  B26D7/20 ,  B26D7/01 ,  B26F1/38 ,  B26D1/10

Abstract: A cell cutting device that cuts a mother substrate for display devices includes a fixing unit configured to move in a state where the mother substrate for display devices is fixed on the fixing unit, a cutter configured to perform a cutting process on the mother substrate for display devices and the cutter faces a surface of the mother substrate during the cutting process, a cutter driving unit driving the cutter in a state where the cutter is fixed thereon, and a buffer member arranged on another surface of the mother substrate to correspond to the cutter. The other surface is opposite the surface facing the cutter.

公开(公告)号：US20140353523A1

公开(公告)日：2014-12-04

申请号：US14094051

申请日：2013-12-02

Applicant: Samsung Display Co., Ltd.

Inventor： Alexander VORONOV ,  Suk-Ho LEE ,  Jae-Seung YOO ,  Kyung-Hoe HEO ,  Gyoo-Wan HAN

IPC: G01N21/64 ,  G01N21/95

CPC classification number: G01N21/6489 ,  G01N21/9501

Abstract: A method for inspecting a polysilicon layer includes: radiating excitation light to the polysilicon layer; and detecting a photoluminescence signal generated by the excitation light, wherein average power of the excitation light has a range of 1 W/cm2 to 10 W/cm2, and peak power of the excitation light has a range of 100 W/cm2 to 1000 W/cm2.

Abstract translation: 一种用于检查多晶硅层的方法包括：向多晶硅层辐射激发光; 并且检测由激发光产生的光致发光信号，其中激发光的平均功率具有1W / cm 2至10W / cm 2的范围，并且激发光的峰值功率具有100W / cm 2至1000W的范围 / cm2。