METHOD FOR INSPECTING POLYSILICON LAYER
    2.
    发明申请
    METHOD FOR INSPECTING POLYSILICON LAYER 有权
    检测多晶硅层的方法

    公开(公告)号:US20140353523A1

    公开(公告)日:2014-12-04

    申请号:US14094051

    申请日:2013-12-02

    IPC分类号: G01N21/64 G01N21/95

    CPC分类号: G01N21/6489 G01N21/9501

    摘要: A method for inspecting a polysilicon layer includes: radiating excitation light to the polysilicon layer; and detecting a photoluminescence signal generated by the excitation light, wherein average power of the excitation light has a range of 1 W/cm2 to 10 W/cm2, and peak power of the excitation light has a range of 100 W/cm2 to 1000 W/cm2.

    摘要翻译: 一种用于检查多晶硅层的方法包括:向多晶硅层辐射激发光; 并且检测由激发光产生的光致发光信号,其中激发光的平均功率具有1W / cm 2至10W / cm 2的范围,并且激发光的峰值功率具有100W / cm 2至1000W的范围 / cm2。

    SHEARING INTERFEROMETER FOR LASER
    6.
    发明申请

    公开(公告)号:US20190154514A1

    公开(公告)日:2019-05-23

    申请号:US16154807

    申请日:2018-10-09

    IPC分类号: G01J9/02

    摘要: A shearing interferometer includes first and second shearing plates disposed opposite to each other. The first shearing plate includes a first front surface and a first back surface, and splits an input beam input to the first front surface into first and second beams reflected at the first front and back surfaces, respectively. The second shearing plate includes a second front surface and a second back surface. The second shearing plate splits the first beam into third and fourth beams reflected at the second front and back surfaces, respectively, and splits the second beam into fifth and sixth beams reflected at the second front and back surfaces, respectively. Each of the first and second shearing plates has a thickness which limits a phase delay between the fourth beam and the fifth beam to a degree determined to allow interference to occur between the fourth beam and the fifth beam.

    OPTICAL SYSTEM
    7.
    发明申请

    公开(公告)号:US20230135389A1

    公开(公告)日:2023-05-04

    申请号:US17979724

    申请日:2022-11-02

    摘要: An optical system includes a phase retardation plate which controls a polarization of an input laser beam, an axicon lens spaced apart from the phase retardation plate on an emitting surface side thereof to convert the input laser beam into a single first Bessel beam having a single cone angle, a collimating lens spaced apart from the axicon lens on an emitting surface side thereof to collimate the single first Bessel beam in a form of a single second Bessel beam having an annular energy distribution, a polarizing beam splitter spaced apart from the collimating lens on an emitting surface side thereof to split the single second Bessel beam into third Bessel beams having different polarization directions, and a focusing lens spaced apart from the polarizing beam splitter on an emitting surface side thereof to focus the plurality of third Bessel beams to form an output laser beam.