公开(公告)号：US20140258778A1

公开(公告)日：2014-09-11

申请号：US14197384

申请日：2014-03-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Deock-Kyum KIMM ,  Dae-Hwan KIM ,  Mi JANG

IPC: G06F11/273

CPC classification number: G06F11/2294

Abstract: An automated test system for a semiconductor device to concurrently perform multiple device tests is provided. The system may include at least one test client, at least one test site and a test server. The at least one test client is configured to receive a test request of at least one worker and to display a test response. The at least one test site is configured to test at least one device under test (DUT). The test server is configured to communicate with the at least one test client and the at least one test site, divide and/or drive the at least one test site in response to the test request of the at least one test client, and transmit a response of the at least one test site to the at least one test client.

Abstract translation: 提供了一种用于半导体器件同时执行多个器件测试的自动化测试系统。 该系统可以包括至少一个测试客户端，至少一个测试站点和测试服务器。 所述至少一个测试客户端被配置为接收至少一个工作者的测试请求并显示测试响应。 至少一个测试站点被配置为测试至少一个被测器件（DUT）。 所述测试服务器被配置为与所述至少一个测试客户端和所述至少一个测试站点进行通信，以响应于所述至少一个测试客户端的所述测试请求来划分和/或驱动所述至少一个测试站点，并且发送 所述至少一个测试站点对所述至少一个测试客户端的响应。