公开(公告)号：US10514308B2

公开(公告)日：2019-12-24

申请号：US15225060

申请日：2016-08-01

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yoon-Kyu Jang ,  Han-Sub Jung ,  Chee-Hoon Lee ,  Jeong-Min Park ,  Jae-Woong Chun

IPC: G01K13/00 ,  H04M1/725 ,  G06F11/30

Abstract: A method of detecting an environment vale of an electronic device is provided. The method includes measuring a state of one or more units related to the electronic device, determining a value based at least in part on the measured state of the one or more units related to the electronic device, determining an operation state of the electronic device according to the value, and generating an approximated environment value according to the operation state. Further, other various embodiments are available.

公开(公告)号：US09404812B2

公开(公告)日：2016-08-02

申请号：US14211680

申请日：2014-03-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yoon-Kyu Jang ,  Han-Sub Jung ,  Chee-Hoon Lee ,  Jeong-Min Park ,  Jae-Woong Chun

IPC: G01K13/00 ,  H04M1/725 ,  G06F11/30

CPC classification number: G01K13/00 ,  G01K2217/00 ,  G06F11/3013 ,  G06F11/3058 ,  H04M1/72522 ,  H04M2250/12

Abstract: A method of detecting an environment vale of an electronic device is provided. The method includes measuring a state of one or more units related to the electronic device, determining a value based at least in part on the measured state of the one or more units related to the electronic device, determining an operation state of the electronic device according to the value, and generating an approximated environment value according to the operation state. Further, other various embodiments are available.

Abstract translation: 提供一种检测电子设备的环境值的方法。 所述方法包括测量与所述电子设备相关的一个或多个单元的状态，至少部分地基于与所述电子设备相关的所述一个或多个单元的测量状态确定值，根据所述电子设备的操作状态来确定所述电子设备的操作状态 并且根据操作状态生成近似环境值。 此外，其他各种实施例是可用的。