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    CIRCUIT FOR TESTING MONITORING CIRCUIT AND OPERATING METHOD THEREOF
    5.
    发明申请
    CIRCUIT FOR TESTING MONITORING CIRCUIT AND OPERATING METHOD THEREOF 有权

    公开(公告)号：US20210172999A1

    公开(公告)日：2021-06-10

    申请号：US16925389

    申请日：2020-07-10

    申请人： SAMSUNG ELECTRONICS CO., LTD.

    发明人： Hyunseok Nam ,  Sangyoung Lee

    IPC分类号： G01R31/28 ,  G01R31/3167

    摘要： A test circuit for testing a monitoring circuit includes: a ramp generator configured to generate a ramp signal in response to an activated first control signal; a counter configured to count pulses of a clock signal in response to the activated first control signal; at least one register configured to store an output value of the counter based on a change in at least one output signal generated by the monitoring circuit in response to the ramp signal in a test mode; and a controller configured to generate the first control signal and verify the monitoring circuit based on a ratio of a value stored in the at least one register to a duration during which the first control signal is activated.