公开(公告)号：US20240053667A1

公开(公告)日：2024-02-15

申请号：US18183890

申请日：2023-03-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongyoung Song ,  Seungwan Jeon ,  Kichrl Park

IPC: G03B43/00

CPC classification number: G03B43/00

Abstract: Methods of adjusting an image sensor may be provided. A test image of a test chart including an evaluation area may be obtained using the image sensor. The evaluation area may have a shape of a circle, wherein the evaluation area includes first through nth unit areas arranged in a rotational direction around the circle, and wherein each of the first through nth unit areas has a different level of brightness. A signal-to-noise ratio (SNR) may be calculated for each of the first through nth unit areas based on the test image of the test chart. A setting of the image sensor may be adjusted based on calculating the signal-to-noise ratio for each of the first through nth unit areas.

公开(公告)号：US12013628B2

公开(公告)日：2024-06-18

申请号：US18183890

申请日：2023-03-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongyoung Song ,  Seungwan Jeon ,  Kichrl Park

IPC: G03B43/00

CPC classification number: G03B43/00

Abstract: Methods of adjusting an image sensor may be provided. A test image of a test chart including an evaluation area may be obtained using the image sensor. The evaluation area may have a shape of a circle, wherein the evaluation area includes first through nth unit areas arranged in a rotational direction around the circle, and wherein each of the first through nth unit areas has a different level of brightness. A signal-to-noise ratio (SNR) may be calculated for each of the first through nth unit areas based on the test image of the test chart. A setting of the image sensor may be adjusted based on calculating the signal-to-noise ratio for each of the first through nth unit areas.

公开(公告)号：US20250142047A1

公开(公告)日：2025-05-01

申请号：US18914804

申请日：2024-10-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sara Lee ,  Seungwan Jeon ,  Junho Han ,  Byoungho Kong ,  Sungsu Kim ,  Kichrl Park ,  Yugyung Lee ,  Subin Han

IPC: H04N17/00

Abstract: An operating method of a camera test device using a test chart includes an operation of receiving, from a camera module, image data generated by imaging the test chart and an operation of measuring a resolution by depth of the camera module from the image data, wherein the test chart is a three-dimensional (3D) chart including a first test pattern radiating from a vertex of the test chart, and the first test pattern is a pattern of an outer surface of the test chart in which white and black surfaces are arranged alternately.

公开(公告)号：US12236567B2

公开(公告)日：2025-02-25

申请号：US17868434

申请日：2022-07-19

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seungwan Jeon ,  Kundong Kim ,  Sungsu Kim ,  Daeil Yu ,  YuGyung Lee ,  Joon-Seo Yim

IPC: G06T7/00 ,  G06T5/20 ,  G06T5/70 ,  G06T7/11 ,  G06T7/37

Abstract: An image evaluation method, including: obtaining a test image including a first lattice pattern formed by image edges; aligning the test image using the image edges to generate an aligned image including a second lattice pattern formed by aligned image edges; generating a compressed image by compressing the aligned image; and generating a quantified result by quantifying a per-pixel difference between the compressed image and the aligned image.