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公开(公告)号:US12236567B2
公开(公告)日:2025-02-25
申请号:US17868434
申请日:2022-07-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seungwan Jeon , Kundong Kim , Sungsu Kim , Daeil Yu , YuGyung Lee , Joon-Seo Yim
Abstract: An image evaluation method, including: obtaining a test image including a first lattice pattern formed by image edges; aligning the test image using the image edges to generate an aligned image including a second lattice pattern formed by aligned image edges; generating a compressed image by compressing the aligned image; and generating a quantified result by quantifying a per-pixel difference between the compressed image and the aligned image.