公开(公告)号：US20170031633A1

公开(公告)日：2017-02-02

申请号：US15204369

申请日：2016-07-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yong In LEE

IPC: G06F3/06

CPC classification number: G06F3/0613 ,  G06F3/0661 ,  G06F3/0688

Abstract: A method of operating a data storage device, which is connected with a host and includes a memory device and a controller, is provided. The method includes receiving, by the controller, a first instance in object-oriented programming language, which corresponds to a write command output from the host; transforming, by the controller, the first instance into first object data; and programming, by the controller, the first object data to the memory device.

Abstract translation: 提供一种操作与主机连接并包括存储器件和控制器的数据存储设备的方法。 该方法包括由控制器接收面向对象编程语言的第一实例，其对应于从主机输出的写入命令; 由控制器将第一个实例转换为第一个对象数据; 以及由所述控制器将所述第一对象数据编程到所述存储器件。

公开(公告)号：US20240205169A1

公开(公告)日：2024-06-20

申请号：US18354341

申请日：2023-07-18

Applicant: Samsung Electronics Co., Ltd.

Inventor： Young Jun HONG ,  Yong In LEE ,  Wonseok LEE

IPC: H04L49/15

CPC classification number: H04L49/15

Abstract: An electronic apparatus includes a plurality of processor device-memory device groups, and each of the plurality of processor device-memory device groups includes a plurality of memory devices respectively comprising one or more memories, a plurality of processor devices respectively comprising one or more processors, and a plurality of switches. Each of the plurality of switches includes a plurality of ports. Each of first memory devices included in a first processor device-memory device group of the plurality of processor device-memory device groups is connected to a first subset of ports of one switch of first switches included in the first processor device-memory device group, and to a first subset of ports of one switch of second switches of the plurality of switches included in a second processor device-memory device group of the plurality of processor device-memory device groups.

公开(公告)号：US20250077407A1

公开(公告)日：2025-03-06

申请号：US18421149

申请日：2024-01-24

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yong In LEE ,  Mincheol KANG

IPC: G06F12/02

Abstract: A memory box includes memory devices comprising memory cells configured to store data, a sensor configured to measure state information of the memory devices, and a mode manager configured to divide the memory devices into a plurality of groups, receive a priority between the plurality of groups from a host device, receive the state information from the sensor, and dynamically control an operation mode of the plurality of groups based on the priority and the state information

公开(公告)号：US20240411682A1

公开(公告)日：2024-12-12

申请号：US18499585

申请日：2023-11-01

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Janghyuk AN ,  Yong In LEE

IPC: G06F12/02 ,  G06F12/1009

Abstract: A Compute Express Link (CXL) memory device includes: memory cell groups configured to store data; one or more sensors configured to measure degradation factors of the memory cell groups; and a control component configured to: receive a memory allocation request from a host device connected to the CXL memory device using CXL; and perform memory allocation of the memory cell groups for the host device based on degradation states of the memory cell groups according to the degradation factors of the memory cell groups.

公开(公告)号：US20230115922A1

公开(公告)日：2023-04-13

申请号：US17749436

申请日：2022-05-20

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yong In LEE ,  In Hwa BAEK ,  Se-Hoon JANG ,  Dong Gap SHIN ,  Young Ho KIM ,  Seung Dae SEOK ,  Si Woong WOO ,  Jun Gyu LEE

IPC: H01J37/32

Abstract: A method for fabricating a semiconductor device includes loading a substrate into a process chamber, processing the substrate in the process chamber, using a plasma generated inside the process chamber, receiving a plasma light emitted from the plasma, selecting a target light from the plasma light, such that the target light is related to a surface condition of the substrate, and analyzing an intensity of the target light over time to monitor the surface condition of the substrate.