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公开(公告)号：US20160178435A1
公开(公告)日：2016-06-23
申请号：US14577573
申请日：2014-12-19
Applicant: Schlumberger Technology Corporation
Inventor： Kentaro Indo , Alexis Petit , Vivek Agarwal , Sepand Ossia , Julian J. Pop , Kai Hsu
CPC classification number: G01J3/0297 , E21B47/01 , E21B49/087 , E21B49/10 , G01V8/02
Abstract: A method for analyzing the condition of a spectrometer is provided. In one embodiment, the method includes acquiring optical data from a spectrometer of a downhole tool during flushing of a flowline and selecting a data set from the acquired optical data. The method can also include estimating light scattering and optical drift for the spectrometer based on the selected data set and determining impacts of the estimated light scattering and optical drift for the spectrometer on measurement accuracy of a characteristic of a downhole fluid determinable through analysis of the downhole fluid using the spectrometer. Additional methods, systems, and devices are also disclosed.
Abstract translation: 提供了一种分析光谱仪条件的方法。 在一个实施例中，该方法包括在冲洗流线期间从井下工具的光谱仪获取光学数据，并从所获取的光学数据中选择数据组。 该方法还可以包括基于所选择的数据集估计光谱仪的光散射和光漂移，并确定光谱仪的估计光散射和光漂移对通过井下分析可确定的井下流体特性的测量精度的影响 流体使用光谱仪。 还公开了附加的方法，系统和装置。
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公开(公告)号：US09612154B2
公开(公告)日：2017-04-04
申请号：US14577573
申请日：2014-12-19
Applicant: Schlumberger Technology Corporation
Inventor： Kentaro Indo , Alexis Petit , Vivek Agarwal , Sepand Ossia , Julian J. Pop , Kai Hsu
CPC classification number: G01J3/0297 , E21B47/01 , E21B49/087 , E21B49/10 , G01V8/02
Abstract: A method for analyzing the condition of a spectrometer is provided. In one embodiment, the method includes acquiring optical data from a spectrometer of a downhole tool during flushing of a flowline and selecting a data set from the acquired optical data. The method can also include estimating light scattering and optical drift for the spectrometer based on the selected data set and determining impacts of the estimated light scattering and optical drift for the spectrometer on measurement accuracy of a characteristic of a downhole fluid determinable through analysis of the downhole fluid using the spectrometer. Additional methods, systems, and devices are also disclosed.
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