公开(公告)号：US11829270B2

公开(公告)日：2023-11-28

申请号：US17516072

申请日：2021-11-01

Applicant: Seagate Technology LLC

Inventor： Stacey Secatch ,  Stephen H. Perlmutter ,  Matthew Stoering ,  Jonathan Henze

IPC: G06F11/00 ,  G06F11/20 ,  G06F11/10 ,  G06F3/06

CPC classification number: G06F11/2094 ,  G06F3/0619 ,  G06F3/0652 ,  G06F3/0656 ,  G06F3/0659 ,  G06F3/0679 ,  G06F11/1004

Abstract: Apparatus and method for a die kill and recovery sequence for a non-volatile memory (NVM). Data are stored in the NVM as data sets in garbage collection units (GCUs) that span multiple semiconductor dies. A die failure management circuit is configured to detect a die failure event associated with a selected die, and to generate a recovery strategy to accommodate the detected die failure event by selecting recovery actions to be taken in a selected sequence to maintain a current level of data transfer performance with a client device. The selected recovery actions are carried out in the selected sequence to transfer at least a portion of the user data stored in the selected die to a new replacement die, after which the selected die is decommissioned from further use. The NVM may be a flash memory of a solid-state drive (SSD).