公开(公告)号：US09435863B2

公开(公告)日：2016-09-06

申请号：US14492067

申请日：2014-09-21

Applicant: Sitronix Technology Corp.

Inventor： Chun-Chi Chen ,  Hung-Wei Lai ,  Tsung-Jun Lee

IPC: G01R31/28 ,  G01R31/319

CPC classification number: G01R31/31908 ,  G01R31/31905

Abstract: An integrated circuit (IC) testing interface capable of upgrading an automatic test equipment (ATE) for testing a semiconductor device includes at least one pin for receiving or transmitting at least a test signal to a tester of the automatic test equipment, a plurality of digitizers coupled to the at least one pin for generating a digital signal, a processing means coupled to the plurality of digitizers for processing the digital signal, and a connection unit for connecting the processing means with a computing device for transmitting an output signal from the processing means to the computing device, where the IC testing interface is disposed between the tester and a prober of the automatic test equipment.

Abstract translation: 一种能够升级用于测试半导体器件的自动测试设备（ATE）的集成电路（IC）测试接口包括至少一个引脚，用于至少接收或发送测试信号到测试仪器的自动测试设备，多个数字化仪 耦合到所述至少一个引脚以产生数字信号;耦合到所述多个数字化器以处理所述数字信号的处理装置;以及连接单元，用于将所述处理装置与用于从处理装置发送输出信号的计算装置 到计算设备，其中IC测试接口被放置在测试器和自动测试设备的探测器之间。

公开(公告)号：US20150212155A1

公开(公告)日：2015-07-30

申请号：US14492067

申请日：2014-09-21

Applicant: Sitronix Technology Corp.

Inventor： Chun-Chi Chen ,  Hung-Wei Lai ,  Tsung-Jun Lee

IPC: G01R31/317 ,  G01R31/3177

CPC classification number: G01R31/31908 ,  G01R31/31905

Abstract: An integrated circuit (IC) testing interface capable of upgrading an automatic test equipment (ATE) for testing a semiconductor device includes at least one pin for receiving or transmitting at least a test signal to a tester of the automatic test equipment, a plurality of digitizers coupled to the at least one pin for generating a digital signal, a processing means coupled to the plurality of digitizers for processing the digital signal, and a connection unit for connecting the processing means with a computing device for transmitting an output signal from the processing means to the computing device, where the IC testing interface is disposed between the tester and a prober of the automatic test equipment.

Abstract translation: 一种能够升级用于测试半导体器件的自动测试设备（ATE）的集成电路（IC）测试接口包括至少一个引脚，用于至少接收或发送测试信号到测试仪器的自动测试设备，多个数字化仪 耦合到所述至少一个引脚以产生数字信号;耦合到所述多个数字化器以处理所述数字信号的处理装置;以及连接单元，用于将所述处理装置与用于从处理装置发送输出信号的计算装置 到计算设备，其中IC测试接口被放置在测试器和自动测试设备的探测器之间。