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公开(公告)号:US20190198352A1
公开(公告)日:2019-06-27
申请号:US15853345
申请日:2017-12-22
Applicant: TEXAS INSTRUMENTS INCORPORATED
IPC: H01L21/56 , H01L23/29 , H01L23/495 , H01L23/50 , H01L23/64 , H01L23/522 , H01L23/00 , C08G59/18
CPC classification number: H01L21/565 , C08G59/18 , H01L23/295 , H01L23/3135 , H01L23/495 , H01L23/49541 , H01L23/50 , H01L23/5223 , H01L23/562 , H01L23/642 , H01L24/03
Abstract: A semiconductor package includes an integrated circuit formed on a semiconductor substrate. A stress buffer layer is provided on the integrated circuit. Further, a mold compound is provided on a surface of the stress buffer layer opposite the integrated circuit. The mold compound comprises a resin. The resin includes filler particles. The filler particles have multiple sizes with the largest of the particles having a size between 5 microns and 32 microns.