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1.
公开(公告)号:US20180019334A1
公开(公告)日:2018-01-18
申请号:US15540993
申请日:2015-12-29
发明人: Raphaël AUBRY , Jean-Claude JACQUET , Olivier PATARD , Nicolas MICHEL , Mourad OUALLI , Sylvain DELAGE
IPC分类号: H01L29/778 , H01L23/29 , H01L29/20 , H01L23/31
CPC分类号: H01L29/7787 , H01L23/291 , H01L23/3171 , H01L29/2003 , H01L29/7786 , H01L2924/0002 , H01L2924/00
摘要: A field-effect transistor comprising a stack of semiconductor materials, the upper face of the stack being covered with a passivation layer comprises two sub-layers: a first sub-layer extending over a second zone of low intensity comprising a first material with electric breakdown field Ecl1, the charge of the first sub-layer being strictly less than the charge of the upper face of the stack, a second sub-layer extending over a first zone of high intensity and covering the first sub-layer, the second sub-layer comprising a second material with electrical breakdown field Ecl2 strictly greater than Ecl1.