公开(公告)号：US20230069309A1

公开(公告)日：2023-03-02

申请号：US17822428

申请日：2022-08-25

Applicant: TOPCON CORPORATION

Inventor： Yoshihiro NISHI ,  Kohei SATO ,  Motohiro MIYAJIMA ,  Toshio YAMADA ,  Takashi TANAKA

IPC: G01C15/00 ,  G01C9/06

Abstract: A tilt analysis method analyzing a tilt of a columnar object is disclosed. The tilt analysis method includes: acquiring a reference value on the basis of a first position of a reflector of a measurement target device attached to a column foot portion of the columnar object; acquiring, in response to an execution instruction, a column top value on the basis of a second position of the reflector of the measurement target device attached to a column top of the columnar object, the execution instruction being received by an input section and inputted via a column top value acquisition instruction section displayed on a display section of a terminal device; generating tilt information indicating in which direction the columnar object tilts based on the reference value and the column top value; and causing the display section to display the tilt information including graphic display.

公开(公告)号：US20230272631A1

公开(公告)日：2023-08-31

申请号：US18005396

申请日：2021-07-09

Applicant: TOPCON CORPORATION

Inventor： Yoshihiro NISHI ,  Kohei SATO ,  Takashi TANAKA

IPC: E04G21/18 ,  G01C15/00

CPC classification number: E04G21/1833 ,  G01C15/004

Abstract: A method using a surveying device 200 and a survey target device 300 includes: performing benchmark measurement including measuring an altitude of a benchmark that serves as a reference height of a batter board; performing stake top measurement including measuring an altitude of a stake top of a batter board stake installed; and performing beam top position display including calculating a difference in height from the stake top of the batter board stake to a beam top based on the reference height of a foundation stored in advance, the altitude of the benchmark, the altitude of the stake top of the batter board stake, and displaying the difference on a terminal device 100.

公开(公告)号：US20230272632A1

公开(公告)日：2023-08-31

申请号：US18005420

申请日：2021-07-09

Applicant: TOPCON CORPORATION

Inventor： Yoshihiro NISHI ,  Kohei SATO ,  Motohiro MIYAJIMA

IPC: E04G21/18 ,  G01C15/00

CPC classification number: E04G21/1833 ,  G01C15/004

Abstract: A method uses a surveying system 1 including a surveying device 200 and a terminal device 100 communicative with the surveying device 200, and includes: acquiring an altitude of a benchmark serving as a reference height on a batter board; acquiring a first altitude difference between the benchmark and a current ground line; acquiring a second altitude difference between the current ground line and a beam top position on the batter board stake; acquiring an altitude of a stake top of a batter board stake installed, by measuring the altitude of the stake top; calculating a third altitude difference between the stake top of the batter board stake and the beam top position based on the altitude of the benchmark, the first and second altitude differences, and the altitude of the stake top; and displaying the third altitude difference on a screen unit of the terminal device.

公开(公告)号：US20230152095A1

公开(公告)日：2023-05-18

申请号：US18054166

申请日：2022-11-10

Applicant: TOPCON CORPORATION

Inventor： Kohei SATO ,  Yoshihiro NISHI ,  Motohiro MIYAJIMA ,  Takashi TANAKA

IPC: G01C15/04

CPC classification number: G01C15/04

Abstract: A surveying method using a surveying system including a surveying device and a terminal. The surveying method includes: receiving, by the terminal, a result of selecting a survey target foundation point from among a plurality of consecutive foundation points; obtaining an intersection between a reference line and a boundary side set in advance, the reference line connecting the survey target foundation point and an adjacent foundation point adjacent to the survey target foundation point; and outputting, in association with the survey target foundation point, a relative positional relationship between the intersection and a survey target device surveyed by the surveying device for the survey target foundation point.