公开(公告)号：US20010012331A1

公开(公告)日：2001-08-09

申请号：US09826256

申请日：2001-04-04

Applicant: U.S. PHILIPS CORPORATION

Inventor： Norbert Conrads ,  Martin Weibrecht ,  Ulrich Schiebel ,  Herfried K. Wieczorek

IPC: H05G001/64

CPC classification number: H04N5/325 ,  H04N5/3597

Abstract: An x-ray examination apparatus comprises an x-ray image sensor matrix (1) for deriving an initial image signal from the x-ray image. The sensor elements of the x-ray sensor matrix convert incident x-rays into electric charges. These electric charges are read-out and converted into the initial image signal. Further a correction unit (2) is provided for correcting the initial image signal, notably for disturbances due to delayed transferred charges, that have been retained in the sensor elements for some time. The correction unit (2) is provided with a memory which stores correction values. Further the correction provided with a selection unit (5) for selecting appropriate correction values from the memory (3).

Abstract translation: x射线检查装置包括用于从x射线图像导出初始图像信号的x射线图像传感器矩阵（1）。 X射线传感器矩阵的传感器元件将入射的X射线转换成电荷。 这些电荷被读出并转换成初始图像信号。 此外，提供校正单元（2），用于校正已经保留在传感器元件中一段时间​​的初始图像信号，特别是用于由于延迟传送的电荷引起的干扰。 校正单元（2）设置有存储校正值的存储器。 此外，还提供了用于从存储器（3）中选择适当的校正值的选择单元（5）。