公开(公告)号：US20010015653A1

公开(公告)日：2001-08-23

申请号：US09790419

申请日：2001-02-22

Applicant: U.S. PHILIPS CORPORATION.

Inventor： Franciscus Gerardus Maria De Jong ,  Rodger Frank Schuttert ,  Johannes De Wilde ,  Gerrit Willem Den Besten ,  Bernardus Martinus Johannes Kup ,  Albertus Jan Paulus Maria Van Uden

IPC: G01R031/02

CPC classification number: G01R31/2853

Abstract: Integrated circuit with a test interface for testing a conductive connection between a supply pad and a supply of a functional block in the integrated circuit. A current test circuit has test inputs coupled to a first and a second point along the conductive connection, for comparing a voltage across the test inputs with a threshold. The current test circuit contains a threshold shifting circuit for shifting the threshold to a shifted value dependent on a voltage across the test inputs when the threshold shifting circuit is active. Testing is executed in two steps, making the threshold shifting circuit active when a first voltage is applied across test inputs and comparing a second voltage at the test input with the shifted threshold. One of the first and second voltage is a voltage drop across the connection when the integrated circuit is set to draw current along said connection, the other one of the first and second voltage is a reference voltage. In an embodiment the integrated circuit has a shunt circuit to provoke current through the conductive connection under test in parallel with current through the functional block.

Abstract translation: 具有测试接口的集成电路，用于测试集成电路中电源焊盘与功能块电源之间的导电连接。 当前测试电路具有耦合到沿着导电连接的第一和第二点的测试输入，用于将测试输入与阈值进行比较。 当阈值移位电路有效时，当前的测试电路包含一个阈值移位电路，用于将阈值移位到取决于测试输入端的电压的移位值。 在两个步骤中执行测试，使得当跨测试输入施加第一电压并且将测试输入处的第二电压与移位的阈值进行比较时，阈值移位电路有效。 第一和第二电压中的一个是当集成电路被设置为沿着所述连接抽取电流时连接上的电压降，第一和第二电压中的另一个是参考电压。 在一个实施例中，集成电路具有分流电路，以使与通过功能块的电流并联的待测导电连接的电流。