SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

    公开(公告)号:US20230386893A1

    公开(公告)日:2023-11-30

    申请号:US17843089

    申请日:2022-06-17

    CPC classification number: H01L21/76251 H01L27/1203 H01L23/562 H01L23/564

    Abstract: A semiconductor structure is provided. The semiconductor structure includes a wafer structure. The wafer structure has a normal region and a trimmed region adjacent to the normal region. A top surface of the trimmed region is lower than a top surface of the normal region. The semiconductor structure includes a dielectric layer and a conductive layer disposed on the wafer structure in the normal region and the trimmed region. The semiconductor structure includes a protective layer disposed on a portion of the dielectric layer in the trimmed region and a portion of the conductive layer in the trimmed region. The semiconductor structure includes another dielectric layer disposed on a portion of the dielectric layer in the normal region and a portion of the conductive layer in the normal region and on the protective layer.

    SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

    公开(公告)号:US20240105502A1

    公开(公告)日:2024-03-28

    申请号:US18537861

    申请日:2023-12-13

    CPC classification number: H01L21/76251 H01L23/562 H01L23/564 H01L27/1203

    Abstract: A semiconductor structure is provided. The semiconductor structure includes a wafer structure. The wafer structure has a normal region and a trimmed region adjacent to the normal region. A top surface of the trimmed region is lower than a top surface of the normal region. The semiconductor structure includes a dielectric layer and a conductive layer disposed on the wafer structure in the normal region and the trimmed region. The semiconductor structure includes a protective layer disposed on a portion of the dielectric layer in the trimmed region and a portion of the conductive layer in the trimmed region. The semiconductor structure includes another dielectric layer disposed on a portion of the dielectric layer in the normal region and a portion of the conductive layer in the normal region and on the protective layer.

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