公开(公告)号：US07898279B2

公开(公告)日：2011-03-01

申请号：US12113962

申请日：2008-05-02

Applicant: Yin Che Chen

Inventor： Yin Che Chen

IPC: G01R31/28

CPC classification number: G01R31/2884

Abstract: The present invention relates to a circuit for multi-pads test, which is used for testing a plurality of pads. The circuit comprises one or more testing circuits, a plurality of testing switches, and a plurality of pad switches. The plurality of testing switches is coupled between the testing circuits and the plurality of pads, respectively; the plurality of pad switches is coupled between the pads, respectively. Thereby, by coordination of the plurality of pad switches and the plurality of testing switches, the number of testing probes of the testing apparatus for testing the pads can be reduced, the design difficulty of the testing apparatus can be reduced, and thus the costs can be reduced.

Abstract translation: 本发明涉及用于多焊盘测试的电路，其用于测试多个焊盘。 电路包括一个或多个测试电路，多个测试开关和多个焊盘开关。 多个测试开关分别耦合在测试电路和多个焊盘之间; 多个焊盘开关分别耦合在焊盘之间。 因此，通过多个焊盘开关和多个测试开关的协调，可以减少用于测试焊盘的测试装置的测试探针的数量，可以减少测试装置的设计难度，因此成本可以 减少