Gyratory compactor apparatuses and associated methods
    91.
    发明授权
    Gyratory compactor apparatuses and associated methods 有权
    旋转式压实机及相关方法

    公开(公告)号:US09234824B1

    公开(公告)日:2016-01-12

    申请号:US14214287

    申请日:2014-03-14

    CPC classification number: G01N3/08 G01N2203/0085 G01N2203/0284

    Abstract: A gyratory compactor apparatus is provided that is adapted to interact with a mold that defines a mold axis. The gyratory compactor apparatus includes a frame that defines a frame axis and has a first mounting plate and a spaced-apart second mounting plate. A pivoted support is carried by the frame and capable of rotation in at least a first and a second rotational degree of freedom. A mold-engaging device is carried by the pivoted support and has a first carriage plate proximal the pivoted support and a second carriage plate axially spaced-apart from the pivoted support for receiving the mold therebetween. At least one actuator having a first end is carried by the frame and a second end is carried by the second carriage plate for imparting lateral translation to the second carriage plate relative to the frame axis. An associated method is also provided.

    Abstract translation: 提供了一种适于与限定模具轴线的模具相互作用的回转式压实机装置。 回转式压实装置包括框架,其限定框架轴线并具有第一安装板和间隔开的第二安装板。 枢转支撑件由框架承载并能够以至少第一和第二旋转自由度旋转。 模具接合装置由枢转支撑件承载,并且具有靠近枢转支撑件的第一托架板和与枢转支承件轴向间隔开的用于在其间接纳模具的第二托架板。 具有第一端的至少一个致动器由框架承载,第二端由第二托架板承载,用于相对于框架轴线向第二托架板施加横向平移。 还提供了相关联的方法。

    Apparatuses and systems for density gauge calibration and reference emulation
    92.
    发明授权
    Apparatuses and systems for density gauge calibration and reference emulation 有权
    用于密度计校准和参考仿真的设备和系统

    公开(公告)号:US09190183B2

    公开(公告)日:2015-11-17

    申请号:US13663414

    申请日:2012-10-29

    Abstract: Apparatuses and systems for emulating electrical characteristics of a material having a known dielectric constant or property are disclosed for standardizing and calibrating of electromagnetic devices. The emulator apparatus can include an electrically non-conductive layer having a dielectric constant less than the material dielectric constant and an electrically conductive layer adjacent the non-conductive layer. Artificial dielectrics for emulating the dielectric constant of a material are also disclosed including a substrate matrix having a dielectric constant less than the material dielectric constant and an additive combined with the substrate, the additive having a dielectric constant higher than the material dielectric constant. Artificial dielectrics may simulate the frequency response of a material relating to a specific property.

    Abstract translation: 公开了用于模拟具有已知介电常数或性质的材料的电特性的装置和系统,用于标准化和校准电磁装置。 仿真器装置可以包括介电常数小于材料介电常数的导电层和与非导电层相邻的导电层。 还公开了用于模拟材料的介电常数的人造电介质,其包括具有小于材料介电常数的介电常数的基底基质和与基底结合的添加剂,所述添加剂具有高于材料介电常数的介电常数。 人造电介质可以模拟与特定性质相关的材料的频率响应。

    MATERIAL PROPERTY GAUGES AND RELATED METHODS FOR DETERMINING A PROPERTY OF A MATERIAL
    93.
    发明申请
    MATERIAL PROPERTY GAUGES AND RELATED METHODS FOR DETERMINING A PROPERTY OF A MATERIAL 有权
    材料性能测量及相关方法确定材料的性质

    公开(公告)号:US20140096605A1

    公开(公告)日:2014-04-10

    申请号:US13794049

    申请日:2013-03-11

    Abstract: The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies.

    Abstract translation: 本文描述的主题包括用于测量材料密度的方法,系统和计算机程序产品。 根据一个方面,材料性能计包括用于测量材料密度的核密度计。 适于将辐射发射到材料中的辐射源和可操作以产生表示所检测到的辐射的信号的辐射检测器。 第一材料性质计算功能可以基于由辐射检测器产生的信号来计算与材料的密度相关联的值。 材料性能测量仪包括确定材料的湿度特性的电磁湿度特性量规。 电磁场发生器可以产生电磁场,其中电磁场扫过一个或多个频率并穿透材料。 电磁传感器可以确定材料对于几个频率上的电磁场的频率响应。

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