Display having gate driver bootstrapping circuitry with enhanced-efficiency

    公开(公告)号:US10522087B2

    公开(公告)日:2019-12-31

    申请号:US15986725

    申请日:2018-05-22

    Applicant: Apple Inc.

    Abstract: A display may have gate driver circuitry that include a series of linked gate driver circuits each of which has an output and has an input coupled to the output of a preceding one of the gate driver circuits. Bootstrapping circuitry may be provided in the gate driver circuitry. Each gate driver circuit may have a bootstrapping circuit that includes transistors and a bootstrapping capacitor. Bootstrapping efficiency may be enhanced by configuring the bootstrapping capacitor to reduce parasitic capacitances. A transistor in each bootstrapping circuit may have first and second source-drain terminals, and a gate terminal that lies between the first and second source-drain terminals and that runs parallel to the first and second source-drain terminals. The bootstrapping capacitor may have a first electrode formed from the gate terminal and a second electrode that overlaps the first electrode and that lies between the first and second source-drain terminals.

    Electronic Devices With Low Refresh Rate Display Pixels

    公开(公告)号:US20190237010A1

    公开(公告)日:2019-08-01

    申请号:US16379323

    申请日:2019-04-09

    Applicant: Apple Inc.

    Abstract: A display may have an array of organic light-emitting diode display pixels operating at a low refresh rate. Each display pixel may have six thin-film transistors and one capacitor. One of the six transistors may serve as the drive transistor and may be compensated using the remaining five transistors and the capacitor. One or more on-bias stress operations may be applied before threshold voltage sampling to mitigate first frame dimming. Multiple anode reset and on-bias stress operations may be inserted during vertical blanking periods to reduce flicker and maintain balance and may also be inserted between successive data refreshes to improve first frame performance. Two different emission signals controlling each pixel may be toggled together using a pulse width modulation scheme to help provide darker black levels.

    Display with light-emitting diodes
    156.
    发明授权

    公开(公告)号:US10354585B2

    公开(公告)日:2019-07-16

    申请号:US15811406

    申请日:2017-11-13

    Applicant: Apple Inc.

    Abstract: A display may have an array of pixels each of which has a light-emitting diode such as an organic light-emitting diode. A drive transistor and an emission transistor may be coupled in series with the light-emitting diode of each pixel between a positive power supply and a ground power supply. The pixels may include first and second switching transistors. A data storage capacitor may be coupled between a gate and source of the drive transistor in each pixel. Signal lines may be provided in columns of pixels to route signals such as data signals, sensed drive currents from the drive transistors, and predetermined voltages between display driver circuitry and the pixels. The switching transistors, emission transistors, and drive transistors may include semiconducting-oxide transistors and silicon transistors and may be n-channel transistors or p-channel transistors.

    Electronic Devices With Low Refresh Rate Display Pixels

    公开(公告)号:US20190057646A1

    公开(公告)日:2019-02-21

    申请号:US15996366

    申请日:2018-06-01

    Applicant: Apple Inc.

    Abstract: A display may have an array of organic light-emitting diode display pixels operating at a low refresh rate. Each display pixel may have six thin-film transistors and one capacitor. One of the six transistors may serve as the drive transistor and may be compensated using the remaining five transistors and the capacitor. One or more on-bias stress operations may be applied before threshold voltage sampling to mitigate first frame dimming. Multiple anode reset and on-bias stress operations may be inserted during vertical blanking periods to reduce flicker and maintain balance and may also be inserted between successive data refreshes to improve first frame performance. Two different emission signals controlling each pixel may be toggled together using a pulse width modulation scheme to help provide darker black levels.

    Light Sensing Display
    159.
    发明申请

    公开(公告)号:US20180348959A1

    公开(公告)日:2018-12-06

    申请号:US15761603

    申请日:2016-07-18

    Applicant: Apple Inc.

    Abstract: A display may have an array of pixels. The pixels may contain light-emitting diodes. When it is desired to use the display to operate as a light sensor, some of the light-emitting diodes may be forward biased to emit light while some of the light-emitting diodes are reversed biased to detect the emitted light after the emitted light has reflected from an external object. During light sensing operations, one or more areas of the display may be temporarily deactivated so that the light-sensing pixels may measure the reflected light. Vertical lines may serve both as data loading lines and as current sensing lines. Currents may be sensed during drive transistor current compensation and during light sensing. The vertical lines may load signals into the pixels that forward bias the light-emitting diodes to emit light when it is desired to display images for a user.

    Corrosion resistant test lines
    160.
    发明授权

    公开(公告)号:US10121843B2

    公开(公告)日:2018-11-06

    申请号:US15176836

    申请日:2016-06-08

    Applicant: Apple Inc.

    Abstract: A display may have an array of pixels formed from thin-film transistor circuitry. The thin-film transistor circuitry may include thin-film layers of dielectric, semiconductor, and metal on a dielectric substrate. Test structures may be formed around the periphery of the substrate to facilitate testing of the thin-film circuitry during manufacturing. The test structures may include test pads that are coupled to the thin-film circuitry by test lines extending from the thin-film circuitry. Following testing, the outermost portions of the display and the test pads on these display portions may be removed by cutting the substrate along a substrate cut line. The test lines may be formed from parallel lines that are shorted together, semiconductor layers, multiple layers of conductive material, and other structures that resist corrosion along the cut line.

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