-
公开(公告)号:US3219987A
公开(公告)日:1965-11-23
申请号:US21275762
申请日:1962-07-19
Applicant: LAB FOR ELECTRONICS INC
Inventor: KELNER ROBERT C
IPC: G11C19/04
CPC classification number: G11C19/04
-
公开(公告)号:US3191015A
公开(公告)日:1965-06-22
申请号:US4499260
申请日:1960-07-25
Applicant: LAB FOR ELECTRONICS INC
Inventor: HANSEN CARL W , ANTHONY CEDRONE
IPC: G06G7/186
CPC classification number: G06G7/1865
-
183.
公开(公告)号:US3189742A
公开(公告)日:1965-06-15
申请号:US15412261
申请日:1961-11-22
Applicant: LAB FOR ELECTRONICS INC
Inventor: LEUBA RICHARD J
IPC: G01T7/04
CPC classification number: G01T7/04
-
公开(公告)号:US3185959A
公开(公告)日:1965-05-25
申请号:US86197559
申请日:1959-12-24
Applicant: LAB FOR ELECTRONICS INC
Inventor: BARKER JOHN L
IPC: G08G1/01
CPC classification number: G08G1/0104
-
公开(公告)号:US3182311A
公开(公告)日:1965-05-04
申请号:US1740660
申请日:1960-03-24
Applicant: LAB FOR ELECTRONICS INC
Inventor: MIDLOCK BERNARD J
-
公开(公告)号:US3175196A
公开(公告)日:1965-03-23
申请号:US17868962
申请日:1962-03-09
Applicant: LAB FOR ELECTRONICS INC
Inventor: LEE JR ROGER K , DARIUS VAKHARIA
CPC classification number: H04N5/82 , G11C13/048
-
187.X-ray analysis system with means to detect only the coherently scattered X-rays 失效
Title translation: X射线分析系统具有仅检测相干散射X射线的手段公开(公告)号:US3154684A
公开(公告)日:1964-10-27
申请号:US3796860
申请日:1960-06-22
Applicant: LAB FOR ELECTRONICS INC
Inventor: ZIEGLER CHARLES A
IPC: G01N23/203
CPC classification number: G01N23/203
-
公开(公告)号:US3148362A
公开(公告)日:1964-09-08
申请号:US17885262
申请日:1962-03-12
Applicant: LAB FOR ELECTRONICS INC
Inventor: PEARSON ROBERT T , MORLEY RICHARD E
IPC: G11B20/00
CPC classification number: G11B20/00007
-
公开(公告)号:US3148360A
公开(公告)日:1964-09-08
申请号:US17260662
申请日:1962-02-12
Applicant: LAB FOR ELECTRONICS INC
Inventor: HALE MURRAY E
IPC: G11C8/00
CPC classification number: G11C8/005
-
公开(公告)号:US3140471A
公开(公告)日:1964-07-07
申请号:US69705857
申请日:1957-11-18
Applicant: LAB FOR ELECTRONICS INC
Inventor: FULLER HARRISON W
CPC classification number: G11C13/06 , G11B5/4946 , G11C8/005 , G11C27/022 , Y10T29/49078
-
-
-
-
-
-
-
-
-