公开(公告)号：US20050231685A1

公开(公告)日：2005-10-20

申请号：US11089205

申请日：2005-03-25

申请人： Junichi Akita ,  Katsuyasu Mizuno ,  Akihiro Fujishiro

发明人： Junichi Akita ,  Katsuyasu Mizuno ,  Akihiro Fujishiro

IPC分类号： A61B3/14 ,  A61B3/10 ,  A61B3/12 ,  A61B3/13 ,  G02B21/06 ,  G02B26/12

CPC分类号： A61B3/1025

摘要： An apparatus for observing an eye of an examinee, comprises: an irradiation optical system for irradiating and two-dimensionally scanning a laser beam onto an observational objective part of the eye; an observation optical system having a photo-receiving element, for photo-receiving the laser beam reflected by the objective part to obtain an image of the objective part, the observation optical system sharing at least a part of the irradiation optical system; a display which displays the obtained image; a polarizing member arranged on an optical axis of the observation optical system, an arrangement angle of the polarizing member with respect to the optical axis being changeable to change a polarized component to be transmitted by the polarizing member.

摘要翻译： 一种用于观察受检者眼睛的装置，包括：照射光学系统，用于将激光束照射并二维地扫描到眼睛的观察目标部分; 具有光接收元件的观察光学系统，用于对由所述物镜部分反射的激光束进行光接收以获得所述目标部分的图像，所述观察光学系统共享所述照射光学系统的至少一部分; 显示所获得的图像的显示器; 偏振构件布置在观察光学系统的光轴上，偏振构件相对于光轴的配置角度可改变以改变由偏振构件透射的偏振分量。

公开(公告)号：US06501552B1

公开(公告)日：2002-12-31

申请号：US09456481

申请日：1999-12-07

申请人： Katsuyasu Mizuno

发明人： Katsuyasu Mizuno

IPC分类号： G01B902

CPC分类号： G01B9/02059 ,  G01B9/02022 ,  G01B9/02058

摘要： An oblique incidence interferometer in which laser light from a laser light source is transmitted through a reference plane and is made incident upon a measurement surface from an oblique direction. The shape of the measurement surface is measured on the basis of interference fringes formed by reflected light reflected from the reference plane and reflected light reflected from the measurement surface. A deflecting element for deflecting the laser light emitted from the laser light source in order to decrease the coherence of the laser light is disposed in an optical path leading to the reference plane, the deflecting element being adapted to continuously change the direction of deflection.

摘要翻译： 一种倾斜入射干涉仪，其中来自激光源的激光透射通过参考平面并从倾斜方向入射到测量表面上。 基于从参考平面反射的反射光和从测量表面反射的反射光形成的干涉条纹来测量测量表面的形状。 用于偏转从激光光源发射的激光以减小激光的相干性的偏转元件设置在通向参考平面的光路中，偏转元件适于连续地改变偏转方向。