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    LITHOTRIPTOR SPACERS AND METHOD
    11.
    发明申请
    LITHOTRIPTOR SPACERS AND METHOD 有权

    公开(公告)号：US20220226009A1

    公开(公告)日：2022-07-21

    申请号：US17648270

    申请日：2022-01-18

    Applicant: OLYMPUS AMERICA INC.

    Inventor： Peter J. Crowley

    IPC: A61B17/225

    Abstract: A medical device and associated methods are disclosed. In one example, the medical device includes a lithotriptor. One or more spacers are included that extend from an outside surface of a hollow shaft of the lithotriptor. At least one longitudinal pathway is included through the one or more lateral spacers. In one example, the one or more lateral spacers includes an elastomer material.

    Ultrasonic inspection configuration with beam overlap verification
    12.
    发明授权
    Ultrasonic inspection configuration with beam overlap verification 有权

    公开(公告)号：US11249053B2

    公开(公告)日：2022-02-15

    申请号：US16657076

    申请日：2019-10-18

    Applicant: OLYMPUS AMERICA INC.

    Inventor： Benoit Lepage

    IPC: G01N29/30 ,  G01N29/26 ,  G01N29/44 ,  G01N29/04

    Abstract: Disclosed is a beam overlap verification system and method for phased array ultrasonic inspection. A scan plan for the ultrasonic inspection defines a suitable probe, wedge and calibration block having machined defects for the geometry to be inspected, and makes a beam definition which defines a set of ultrasonic beams emitted by the phased array. An intersection amplitude unit records the response amplitudes from each defect at predetermined intersection points of adjacent beam pairs as the probe and wedge are manually scanned across the calibration block. An overlap verification module determines the −6 dB overlap of all adjacent beam pairs which are relevant to the geometry to be inspected, and verifies that the beam overlap conforms to the required coverage according to the ASME or other relevant codes. In this way, coverage is experimentally verified during calibration prior to inspection of a known geometry, such as a weld.

    Ultrasonic TFM with calculated angle beams
    14.
    发明授权
    Ultrasonic TFM with calculated angle beams 有权

    公开(公告)号：US11029289B2

    公开(公告)日：2021-06-08

    申请号：US15849195

    申请日：2017-12-20

    Applicant: OLYMPUS AMERICA INC.

    Inventor： Jason Habermehl ,  Benoit Lepage

    IPC: G01N29/07 ,  G01N29/44 ,  G01N29/34 ,  G01N29/06

    Abstract: Disclosed is an apparatus and method for TFM post-processing of a FMC or HMC matrix acquired with an ultrasonic array probe. Post-processing is performed by calculating TFM beam forming amplitudes using round-trip delays to a focal point lying at depth d on a line at angle θ within the test object. Based on the beam forming amplitudes over a range of values of d within the imaging volume, a calculated A-scan is derived, which is equivalent to the response A-scan produced in conventional phased array imaging, but has the advantage of being focused at all points along the line. By post-calculation of calculated A-scans over a range of angles θ within the imaging volume, an imaging method is derived which is readily adapted to existing codes based on conventional A-scan imaging.

    EDDY CURRENT ARRAY PROBE AND METHOD FOR LIFT-OFF COMPENSATION DURING OPERATION WITHOUT KNOWN LIFT REFERENCES
    18.
    发明申请
    EDDY CURRENT ARRAY PROBE AND METHOD FOR LIFT-OFF COMPENSATION DURING OPERATION WITHOUT KNOWN LIFT REFERENCES 有权

    公开(公告)号：US20210010975A1

    公开(公告)日：2021-01-14

    申请号：US17034811

    申请日：2020-09-28

    Applicant: OLYMPUS AMERICA INC.

    Inventor： Benoit Lepage

    IPC: G01N27/90

    Abstract: The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.

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